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YD/T 1763.1-2008 English PDF (YDT1763.1-2008)

YD/T 1763.1-2008 English PDF (YDT1763.1-2008)

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YD/T 1763.1-2008: TD-SCDMA/WCDMA Digital Cellular Mobile Communication Network Test Methods for USIM-ME (Cu) Interface - Part 1: Physical, Electrical and Logical Characteristics

This Standard defines the test methods and expected test results of the physical, electrical and logical characteristics of USIM-ME Cu interface. The present document specifies the tests of: physical characteristics of Cu interface, electrical characteristics of Cu interface, initial communication establishment and the transport protocols as well as the application independent procedures. This Standard applies not only for tests of Cu interface between USIM and TD-SCDMA mobile equipment, but also for tests of Cu interface between USIM and WCDMA mobile equipment.
YD/T 1763.1-2008
YD
Telecommunication Industry Standard
Of the PEOPLE Republic of China
TD-SCDMA/WCDMA Digital Cellular Mobile
Telecommunication Network Test methods for
USIM-ME (Cu) Interface
Part 1. Physical, Electrical and Logical
Characteristics
ISSUED ON. MARCH 13, 2008
IMPLEMENTED ON. JULY 1, 2008
Issued by. Ministry of Industry Information Technology, the PEOPLE
Republic of China
Table of Contents
Preface ... 6
1 Scope ... 8
2 Quoted Standards ... 8
3 Definitions, Symbols, Abbreviations and Coding Conventions ... 9
3.1 Definitions ... 9
3.2 Symbols ... 10
3.3 Abbreviations ... 10
3.4 Coding Conventions ... 12
4 Physical Characteristic Tests ... 12
4.1 Contact Pressure ... 12
4.1.1. Definition and applicability ... 12
4.1.2 Conformance requirement ... 12
4.1.3 Test Purpose ... 12
4.1.4 Method of test ... 13
4.1.5 Expected test result ... 13
4.2 Curvature of the Contacting Elements ... 13
4.2.1. Definition and applicability ... 13
4.2.2 Conformance requirement ... 13
4.2.3 Test Purpose ... 13
4.2.4 Method of test ... 13
4.2.5 Expected test result ... 13
5 Electrical Characteristic Tests ... 13
5.1 Test of the Power Transition Phases ... 14
5.1.1 Phase proceeding ME power on ... 14
5.1.2 Phase during USIM power on ... 14
5.1.2 Phase during ME power off ... 15
5.1.4 Warm reset timing ... 17
5.1.5 USIM type recognition and voltage switching ... 18
5.2 Electrical Tests on Each ME Contact ... 24
5.2.1 Nominal test conditions ... 24
5.2.2 Electrical tests on contact C1 (VCC) ... 25
5.2.3 Electrical tests on contact C2 (RST) ... 29
5.2.4 Electrical tests on contact C3 (CLK) ... 30
5.2.5 Electrical tests on contact C7 (I/O) ... 31
6 Initial Communication Tests ... 33
6.1 ATR ... 33
6.1.1 ATR characters ... 33
6.2 Clock Stop Mode with 1.8V Technology USIM ... 38
6.2.1 Definition and applicability ... 38
6.2.2 Conformance requirement ... 38
6.2.3 Test purpose ... 39
6.2.4 Method of test ... 39
6.2.5 Expected test result ... 41
6.3 Clock Stop Mode with 3V Technology USIM ... 41
6.3.1 Definition and applicability ... 41
6.3.2 Conformance requirement ... 42
6.3.3 Test purpose ... 42
6.3.4 Method of test ... 42
6.3.5 Expected test result ... 44
6.4 Speed Enhancement ... 45
6.4.1 Definition and applicability ... 45
6.4.2 Conformance requirement ... 45
6.4.3 Test purpose ... 45
6.4.4 Method of test ... 45
6.4.5 Expected test result ... 46
7 Transmission Protocol Tests ... 47
7.1 Character Transmission ... 47
7.1.1 Bit/character duration during the transmission from the ME to the USIM ... 47 7.1.2 Bit/character duration during the transmission from the USIM to the ME ... 47 7.2 T=0 Protocol ... 48
7.2.1 Timing ... 48
7.2.2 Command processing, ACK, NACK, NULL procedure bytes ... 50
7.2.3 Case 2 command, use of procedure bytes ?€?61XX?€? and ?€?6CXX?€? ... 51
7.2.4 Case 4 command, use of procedure bytes ?€?61XX?€? ... 52
7.2.5 Command processing, warning and error status bytes ... 53
7.2.6 Error correction ... 54
7.2.7 Error detection ... 54
7.3 T=1 Protocol ... 55
7.3.1 Character Waiting Time ... 55
7.3.2 Blocking Timing ... 57
7.3.3 Blocking Waiting Time extension ... 58
7.3.4 Chaining ?€? respect of IFSC by ME ... 60
7.3.5 Chaining ?€? IFSD management ... 63
7.3.6 I-Block error correction ...

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