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YD/T 1763.1-2008 English PDF (YDT1763.1-2008)

YD/T 1763.1-2008 English PDF (YDT1763.1-2008)

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Newer version: (Replacing this standard) YD/T 1763.1-2011
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See Chinese contents: YD/T 1763.1-2008
YD/T 1763.1-2008: TD-SCDMA/WCDMA Digital Cellular Mobile Communication Network Test Methods for USIM-ME (Cu) Interface - Part 1: Physical, Electrical and Logical Characteristics
This Standard defines the test methods and expected test results of the physical, electrical and logical characteristics of USIM-ME Cu interface. The present document specifies the tests of: physical characteristics of Cu interface, electrical characteristics of Cu interface, initial communication establishment and the transport protocols as well as the application independent procedures. This Standard applies not only for tests of Cu interface between USIM and TD-SCDMA mobile equipment, but also for tests of Cu interface between USIM and WCDMA mobile equipment.

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