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SJ/T 11654-2016 English PDF (SJT11654-2016)

SJ/T 11654-2016 English PDF (SJT11654-2016)

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SJ/T 11654-2016: General Specification for Solid State Disk

This Standard specifies the requirements, test method, quality assessment procedure, marking, packaging, transportation and storage of solid-state disk. This Standard is applicable to the design, production, manufacture and inspection of the solid-state disk (hereinafter refer to as ?????product????€); reference may also be made to other devices containing solid-state disk functional modules.
SJ/T 11654-2016
SJ
ELECTRONIC INDUSTRY STANDARD
OF THE PEOPLE REPUBLIC OF CHINA
ICS 35.220.20
L 63
Report No.:
General Specification for Solid State Disk
ISSUED ON: APRIL 05, 2016
IMPLEMENTED ON: SEPTEMBER 01, 2016
Issued by: Ministry of Industry and Information Technology of the PEOPLE Republic of China
Table of Contents
Foreword ... 3
1 Scope ... 4
2 Normative References ... 4
3 Terms and Definitions ... 5
4 Requirements ... 7
5 Test Method ... 12
6 Quality Assessment Procedures ... 20
7 Marking, Packaging, Transportation, and Storage ... 22
Appendix A (Informative) Product Appearance and Installation Size ... 24 Appendix B (Informative) Interface ... 28
Appendix C (Normative) Failure judgment ... 34
General Specification for Solid State Disk
1 Scope
This Standard specifies the requirements, test method, quality assessment procedure, marking, packaging, transportation and storage of solid-state disk.
This Standard is applicable to the design, production, manufacture and inspection of the solid- state disk (hereinafter refer to as ?€?product?€?); reference may also be made to other devices containing solid-state disk functional modules.
2 Normative References
The following documents are essential to the application of this Document. For the dated documents, only the versions with the dates indicated are applicable to this Document; for the undated documents, only the latest version (including all the amendments) is applicable to this Document.
GB/T 191 Packaging ?€? Pictorial Marking for Handling of Goods
GB/T 2421.1 Environmental Testing for Electric and Electronic products - General and Guidance
GB/T 2422 Environmental testing for electric and electronic products - Terms and definitions
GB/T 2423.1 Environmental testing for electric and electronic products - Part 2: Test methods - Tests A: Cold
GB/T 2423.2 Environmental testing for electric and electronic products - Part 2: Test methods - Tests B: Dry heat
GB/T 2423.3 Environmental testing for electric and electronic products - Part 2: Test methods - Test Ca: Damp heat, steady state
GB/T 2423.5 Environmental testing for electric and electronic products - Part 2: Test methods ?€? Test Ea and guidance: Shock
GB/T 2423.10 Environmental testing for electric and electronic products - Part 2: Test methods ?€? Test Fc and guidance: Vibration (Sinusoidal)
NOTE 3: The semiconductor memory chips that make up the solid-state disk have the ability to be programmed for many times.
3.2 Lifespan (Endurance)
Under the condition that the data is guaranteed to be correct, the number of times the solid-state disk can normally perform read and write operations.
3.3 Nominal capacity
The solid-state disk capacity announced by the solid-state disk manufacturer that is calculated in decimal numbers.
NOTE: It is expressed by GB or TB; thereof, 1GB=109 bytes, and 1TB=1012 bytes. 3.4 Data transfer rate
The number of data bits transmitted per unit time that is calculated in a binary number. NOTE: It is expressed by Mb/sec or Gb/sec; thereof, Mb/sec=220bit/sec, and Gb/sec=230bit/sec. 3.5 Read performance
The number of data bytes read from the solid-state disk per unit time or the number of read operations per unit time.
3.6 Write performance
The number of data bytes written to the solid-state disk per unit time or the number of write operations per unit time.
3.7 Recoverable read error
An error occurred while reading data, and the error is recoverable within the specified number of retries.
3.8 Unrecoverable read error
An error that is found when reading data, and the error is not recoverable within the specified number of retries.
3.9 Power on to ready time
Time that is required from power-on to data readout.
3.10 Interface
The interface for connecting the solid-state disk to other devices.
3.11 Active power consumption
Energy consumption when the solid-state disk is in the read/write state. NOTE: The unit is Joule (J).
3.12 Idle power consumption
Energy consumption when the solid-state disk is in the idle state.
NOTE: The unit is Joule (J).
4 Requirements
4.1 Appearance and structure
4.1.1 General requirements
There shall be no obvious dents, scratches, cracks, deformations, etc. on the surface of the product; the surface coating shall not be blistered, cracked or peeled off; and the metal parts shall not be rusted or otherwise mechanically damaged.
There is no damage to the connector; and it is easy to plug and unplug. Other parts shall be firm and not loose.
The texts and symbols and explaining the function, and function display shall be clear and correct.
4.1.2 Structure size
4.1.2.1 1.8?€??€? solid-state disk
The schematic diagram of the shape and structure of 1.8?€??€? solid-state disk can refer to Appendix A. The pin arrangement and its dimension can refer to Appendix B.
4.1.2.2 2.5?€??€? solid-state disk
The schematic diagram of the shape and structure of 2.5?€??€? solid-state disk can refer to Appendix A. The pin arrangement and its dimension can refer to Appendix B.
4.1.2.3 3.5?€??€? solid-state disk
The schematic diagram of the shape and structure of 3.5?€??€? solid-state disk can refer to Appendix A. The pin arrangement and its dimension can refer to Appendix B.
4.1.2.4 Solid-state disks of other sizes
a) If the power loss occurs when the product controller is writing data into the flash memory chip: in this case, the loses the file data being operated are allowed; and no hardware damage is required;
b) If the power loss occurs when the product controller is not writing data to the flash memory chip: in this case, no data loss or error is allowed.
4.6 Lifespan
The lifespan shall meet the lifespan requirements stipulated in the product manual. 4.7 Error rate
In the 25??C temperature environment, when the relative humidity of the extreme environment does not exceed 65%, there shall be no more than one unrecoverable read error rate for every 1013 data reads.
4.8 Security
4.8.1 General requirements
The general security requirements of the product shall comply with the provisions of 1.3 in GB 4943.1-2011.
4.8.2 Touch current
The touch current of the product shall comply with the provisions of 5.1 in GB 4943.1-2011. 4.8.3 Dielectric strength
The dielectric strength of the product shall comply with the provisions of 5.2 in GB 4943.1- 2011.
4.8.4 Ground continuity
The ground continuity of the product shall comply with the provisions of 2.6 in GB 4943.1- 2011.
4.8.5 Protection function
The product shall have protection functions such as overcurrent, overvoltage and short circuit, etc.
4.9 Power accommodation capacity
The product shall work normally under the conditions with voltage of 12V??10% and 5V??5%. The product shall have the protection functions such as overcurrent, overvoltage and short circuit, etc.
GB/T 26572.
5 Test Method
5.1 Test environmental condition
In addition to climate environmental test and reliability test, other tests in this Standard shall be carried out under standard atmospheric conditions for testing:
a) Temperature: 15??C~35??C;
b) Relative humidity: 25%~75%;
c) Atmospheric pressure: 86kPa~106kPa.
In all test items, the magnetic field strength around the sample under test shall not exceed 2000 A/m; and the air shall not contain salt spray and corrosive substances. 5.2 Appearance and structure test
The appearance of the product is tested by manual visual inspection; the shape dimension of the product is tested by a length measuring instrument; and the weight of the product is tested by a precision weight measuring instrument. All tests shall meet the requirements of 4.1. NOTE: The product during the appearance and weight inspection shall be the product that has been pasted with various labels.
5.3 Power on to ready time test
The time interval between when the test product is powered on and ready to start read/write operations. Repeat the test 1000 times; and then take the average value as the power on to ready time.
5.4 Data transfer rate test
5.4.1 Simple sequential read data capability test
Continuously send 10,000 read requests to the product; the start address of each read request is the end address of the previous read request; record the response time of each request; and calculate the data bandwidth according to Formula (1).
Where:
B ?€? data bandwidth under such experimental condition;
TR0 ?€? response time at the zero request, in s;
TR1 ?€? response time at the 1st request, in s, and so on;
S - the size of the requested data is set to 2KB and 1MB in the experiment, and the performance of small/large block reading and writing can be obtained, respectively. 5.4.2 Simple random read data capability test
Continuously send 10,000 read requests to the product; the start address of each read request is randomly generated between 0 and the maximum logical address; record the response time of each request; and calculate the data bandwidth according to Formula (1). 5.4.3 Simple sequential write data capability test
Continuously send 10,000 write requests to the product; the start address of each write request is the end address of the previous write request; record the response time of each request; and calculate the data bandwidth according to Formula (1).
NOTE: The data written down is randomly generated.
5.4.4 Simple random data writing capability test
Continuously send 10,000 write requests to the product; the start address of each write request is randomly generated between 0 and the large sector number; record the response time of each request; and calculate the data bandwidth according to Formula (1).
NOTE: The data written down is randomly generated.
5.5 Power consumption test
5.5.1 Active power consumption
Use the four methods in 5.4; record the working voltage, working current, and working time of the solid-state disk under these four methods at the same time; and then obtain the working power consumption under these four methods, respectively. The power consumption is calculated according to Formula (2). [Translator?€?s note: There is background watermark in some formulas and figures]
Where:
E - the energy consumed to serve the target load, in J;
I ?€? average working current, in A;
NOTE: Both the amount of written data and the number of days can be used as the measurable indicator. 5.8 Error rate test
It shall be carried out according to the provisions of GB/T 5080.7.
5.9 Security test
5.9.1 General security test
It shall be carried out according to the provisions of 1.4 in GB 4943.1-2011. 5.9.2 Touch current test
The touch current test shall be measured according to the provisions of 5.1 in GB 4943.1-2011; its limit value shall not exceed the maximum current in Table 5A of GB 4943.1-2011. 5.9.3 Dielectric strength test
The dielectric strength test shall be carried out according to the provisions of 5.2 in GB 4943.1- 2011; the voltage maintenance time for the type inspection and periodic inspection is 60s; and the batch-by-batch inspection is maintained for 1s. During the test, the insulation shall not be broken down.
Batch-by-batch inspection (including end of production line) for dielectric strength is carried out only once per product.
5.9.4 Grounding continuity test
The grounding continuity test shall be carried out according to the provisions of 2.6 in GB 4943.1-2011. The connection resistance between the ground terminal and the parts that need to be grounded (such as the external box) shall not exceed 0.1??.
5.10 Power accommodation capacity test
5.10.1 Voltage withstand test
The power accommodation capacity test is tested 3 times according to the upper and lower limits of the voltage that can be tolerated; and the sample under test shall work normally. 5.10.2 Overcurrent protection value test
The input voltage is the nominal voltage; the initial load current is the rated load; and the current climbs at a rate of 0.1A/s.
When the product is working normally under the above conditions, gradually increase the current. When the load current enters the over-current protection range, it shall be automatically protected. After the over-current is removed, it shall be able to work normally after restarting or automatically recovering.
5.10.3 Short circuit test
When the input voltage is the nominal value and the minimum load current is set to 10% of the rated current, the product works normally, and then the output voltage is artificially short- circuited, and the short-circuit impedance shall be less than 100m??, the short-circuit time is at least 1s; then the product shall be able to automatically protected. Restart or automatic restore after troubleshooting, the product should work normally.
5.10.4 DC overvoltage protection action value test
When the input voltage is the nominal value and the load current is 5% of the rated load, adjust the output voltage to generate overvoltage. When the output voltage exceeds the overvoltage protection value, the product shall be automatically protected. Restart or automatically restore after troubleshooting, the product shall work normally. Use an oscilloscope to measure the overvoltage protection value and the time it takes to return to 110% of the nominal value. If it is difficult to test according to this method, then turn to analyze the product circuit to confirm whether the product has the output overvoltage protection function.
5.11 Climate environmental adaptability test
5.11.1 General requirements
In this Standard, the principals and terms of environmental test methods shall comply with the relevant provisions of GB/T 2421.1 and GB/T 2422.
5.11.2 Temperature lower limit test
5.11.2.1 Working temperature lower limit test
It shall be carried out according to "Test Ad" of GB/T 2423.1. The sample under test must be subjected to initial testing, and the severity shall be the lower limit of the specified working temperature. When the temperature reaches the specified value, turn on the power supply and work at full load for 2h; and it shall work normally. The recovery time is 2h. 5.11.2.2 Storage temperature lower limit test
It shall be carried out according to "Test Ab" of GB/T 2423.1. The sample under test must be subjected to initial testing, and the severity shall be the lower limit of the specified storage temperature. The sample under test shall be stored for 16h under non-working conditions, and the recovery time shall be 2h; and then the final testing shall be carried out. In order to prevent the sample under test from frosting and condensation during the test, it is allowed to seal the test sample with a polyethylene film and then carry out the test. If necessary, a moisture-absorbing agent can also be placed in the sealing sleeve.
5.11.3 Temperature upper limit test
5.11.3.1 Working temperature upper limit test
It shall be carried out according to "Test Bd" of GB/T 2423.2. The sample under test must be subjected to initial testing, and the severity shall be the upper limit of the specified working temperature. When the temperature reaches the specified value, turn on the power supply and work at full load for 2h, it shall work normally. The recovery time is 2h. 5.11.3.2 Storage temperature upper limit test
It shall be carried out according to "Test Bd" of GB/T 2423.2. The sample under test must be subjected to initial testing, and the severity shall be the upper limit of the specified storage temperature. The sample under test shall be stored for 16h under non-working conditions, and the recovery time shall be 2h; and then the final testing shall be carried out. 5.11.4 Constant damp heat test
5.11.4.1 Constant damp heat test under working conditions
It shall be carried out according to "Test Ca" of GB/T 2423.3. The samples under test must be subjected to initial testing, and the severity shall be the upper limit of working temperature and humidity specified in Table 2. When the temperature and humidity reach the specified values, the power supply shall be turned on and work at full load for 2h; it shall work normally. The recovery time is 2h.
5.11.4.2 Constant damp heat test under storage conditions
It shall be carried out according to "Test Ca" of GB/T 2423.3. The sample under test must be subjected to initial testing. The sample under test is stored at the specified upper limit storage temperature and humidity under non-working conditions for 48h; and the recovery time is 2h, and the final testing is carried out.
5.12 Shock and vibration adaptability test
5.12.1 Shock adaptability test
It shall be carried out according to "Test Ea" of GB/T 2423.5. The sample under test shall be subjected to initial testing; and attention shall be paid to the influence of gravity during installation. According to the specified value of shock adaptability, under the relevant state, shock on three mutually perpendicular axis directions, and the number of shocks is three times. 5.12.2 Vibration adaptability test
It shall be carried out according to "Test Fc" of GB/T 2423.10. The sample under test must be subjected to initial testing, and fixed on the vibration table according to the working position. The sample under test shall be tested according to the specified value of the vibration The test shall be carried out according to the method specified in GB 17625.1. 5.14 Reliability test
5.14.1 Test conditions
This Standard stipulates that the purpose of the reliability test is to determine the reliability level of the product under normal use conditions; and the comprehensive stress within the test cycle is specified as follows:
a) Electrical stress: The sample under test works for one cycle within ??5% of the nominal value of the input voltage; and the distribution of working time in one cycle is: 25% of the upper limit of the voltage, 50% of the nominal value, and 25% of the lower limit of the voltage.
b) Temperature stress: The sample under test rises from the normal temperature (the specific value is specified by the product standard) to the upper limit (or drop to the lower limit) of the working temperature specified in the climate adaptability within one cycle and then returns to the normal temperature. The average temperature change rate is (0.7~1) ??C/min or select other values according to the special requirements of the sample under test. The ratio of the duration between the upper limit (or lower limit) and the normal temperature in one cycle shall be about 1:1; and the upper limit temperature is 70??C.
A cycle is called a circulation; and the number of cycles shall be no less than three in the total test period. The duration of each cycle shall be no greater than 0.2m1; and electrical stress and temperature stress shall be applied simultaneously.
5.14.2 Test plan
The reliability test shall be carried out according to GB/T 5080.7; and the test scheme of the reliability identification test and reliability acceptance test shall be specified in the product standard. The product shall work normally throughout the test.
5.14.3 Test time
The test time shall last until the total test time and the total number of failures can be accepted or rejected according to the selected test plan. When multiple test samples are tested, the test time of each test sample shall be no less than half of the average test time of all test samples. 5.15 Determinati...

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