SJ/T 11654-2016 English PDF (SJT11654-2016)

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SJ/T 11654-2016: General Specification for Solid State Disk
SJ/T 11654-2016
SJ
ELECTRONIC INDUSTRY STANDARD
OF THE PEOPLE’S REPUBLIC OF CHINA
ICS 35.220.20
L 63
Report No.:
General Specification for Solid State Disk
ISSUED ON: APRIL 05, 2016
IMPLEMENTED ON: SEPTEMBER 01, 2016
Issued by: Ministry of Industry and Information Technology of the People’s
Republic of China
Table of Contents
Foreword ... 3
1 Scope ... 4
2 Normative References ... 4
3 Terms and Definitions ... 5
4 Requirements ... 7
5 Test Method ... 12
6 Quality Assessment Procedures ... 20
7 Marking, Packaging, Transportation, and Storage ... 22
Appendix A (Informative) Product Appearance and Installation Size ... 24
Appendix B (Informative) Interface ... 28
Appendix C (Normative) Failure judgment ... 34
General Specification for Solid State Disk
1 Scope
This Standard specifies the requirements, test method, quality assessment procedure, marking,
packaging, transportation and storage of solid-state disk.
This Standard is applicable to the design, production, manufacture and inspection of the solid-
state disk (hereinafter refer to as “product”); reference may also be made to other devices
containing solid-state disk functional modules.
2 Normative References
The following documents are essential to the application of this Document. For the dated
documents, only the versions with the dates indicated are applicable to this Document; for the
undated documents, only the latest version (including all the amendments) is applicable to this
Document.
GB/T 191 Packaging – Pictorial Marking for Handling of Goods
GB/T 2421.1 Environmental Testing for Electric and Electronic products - General and
Guidance
GB/T 2422 Environmental testing for electric and electronic products - Terms and
definitions
GB/T 2423.1 Environmental testing for electric and electronic products - Part 2: Test
methods - Tests A: Cold
GB/T 2423.2 Environmental testing for electric and electronic products - Part 2: Test
methods - Tests B: Dry heat
GB/T 2423.3 Environmental testing for electric and electronic products - Part 2: Test
methods - Test Ca: Damp heat, steady state
GB/T 2423.5 Environmental testing for electric and electronic products - Part 2: Test
methods – Test Ea and guidance: Shock
GB/T 2423.10 Environmental testing for electric and electronic products - Part 2: Test
methods – Test Fc and guidance: Vibration (Sinusoidal)
NOTE 3: The semiconductor memory chips that make up the solid-state disk have the ability to be
programmed for many times.
3.2 Lifespan (Endurance)
Under the condition that the data is guaranteed to be correct, the number of times the solid-state
disk can normally perform read and write operations.
3.3 Nominal capacity
The solid-state disk capacity announced by the solid-state disk manufacturer that is calculated
in decimal numbers.
NOTE: It is expressed by GB or TB; thereof, 1GB=109 bytes, and 1TB=1012 bytes.
3.4 Data transfer rate
The number of data bits transmitted per unit time that is calculated in a binary number.
NOTE: It is expressed by Mb/sec or Gb/sec; thereof, Mb/sec=220bit/sec, and Gb/sec=230bit/sec.
3.5 Read performance
The number of data bytes read from the solid-state disk per unit time or the number of read
operations per unit time.
3.6 Write performance
The number of data bytes written to the solid-state disk per unit time or the number of write
operations per unit time.
3.7 Recoverable read error
An error occurred while reading data, and the error is recoverable within the specified number
of retries.
3.8 Unrecoverable read error
An error that is found when reading data, and the error is not recoverable within the specified
number of retries.
3.9 Power on to ready time
Time that is required from power-on to data readout.
3.10 Interface
The interface for connecting the solid-state disk to other devices.
3.11 Active power consumption
Energy consumption when the solid-state disk is in the read/write state.
NOTE: The unit is Joule (J).
3.12 Idle power consumption
Energy consumption when the solid-state disk is in the idle state.
NOTE: The unit is Joule (J).
4 Requirements
4.1 Appearance and structure
4.1.1 General requirements
There shall be no obvious dents, scratches, cracks, deformations, etc. on the surface of the
product; the surface coating shall not be blistered, cracked or peeled off; and the metal parts
shall not be rusted or otherwise mechanically damaged.
There is no damage to the connector; and it is easy to plug and unplug. Other parts shall be firm
and not loose.
The texts and symbols and explaining the function, and function display shall be clear and
correct.
4.1.2 Structure size
4.1.2.1 1.8’’ solid-state disk
The schematic diagram of the shape and structure of 1.8’’ solid-state disk can refer to Appendix
A. The pin arrangement and its dimension can refer to Appendix B.
4.1.2.2 2.5’’ solid-state disk
The schematic diagram of the shape and structure of 2.5’’ solid-state disk can refer to Appendix
A. The pin arrangement and its dimension can refer to Appendix B.
4.1.2.3 3.5’’ solid-state disk
The schematic diagram of the shape and structure of 3.5’’ solid-state disk can refer to Appendix
A. The pin arrangement and its dimension can refer to Appendix B.
4.1.2.4 Solid-state disks of other sizes
a) If the power loss occurs when the product controller is writing data into the flash memory
chip: in this case, the loses the file data being operated are allowed; and no hardware
damage is required;
b) If the power loss occurs when the product controller is not writing data to the flash
memory chip: in this case, no data loss or error is allowed.
4.6 Lifespan
The lifespan shall meet the lifespan requirements stipulated in the product manual.
4.7 Error rate
In the 25°C temperature environment, when the relative humidity of the extreme environment
does not exceed 65%, there shall be no more than one unrecoverable read error rate for every
1013 data reads.
4.8 Security
4.8.1 General requirements
The general security requirements of the product shall comply with the provisions of 1.3 in GB
4943.1-2011.
4.8.2 Touch current
The touch current of the product shall comply with the provisions of 5.1 in GB 4943.1-2011.
4.8.3 Dielectric strength
The dielectric strength of the product shall comply with the provisions of 5.2 in GB 4943.1-
2011.
4.8.4 Ground continuity
The ground continuity of the product shall comply with the provisions of 2.6 in GB 4943.1-
2011.
4.8.5 Protection function
The product shall have protection functions such as overcurrent, overvoltage and short circuit,
etc.
4.9 Power accommodation capacity
The product shall work normally under the conditions with voltage of 12V±10% and 5V±5%.
The product shall have the protection functions such as overcurrent, overvoltage and short
circuit, etc.
GB/T 26572.
5 Test Method
5.1 Test environmental condition
In addition to climate environmental test and reliability test, other tests in this Standard shall be
carried out under standard atmospheric conditions for testing:
a) Temperature: 15°C~35°C;
b) Relative humidity: 25%~75%;
c) Atmospheric pressure: 86kPa~106kPa.
In all test items, the magnetic field strength around the sample under test shall not exceed 2000
A/m; and the air shall not contain salt spray and corrosive substances.
5.2 Appearance and structure test
The appe...