This standard specifies the analysis method principles, reagents and materials, instruments, samples, analysis steps, result reports, safety precautions, for using polycrystalline X-ray diffractometers, to analyze the phase composition of various polycrystalline materials. This standard applies to conventional polycrystal X-ray diffractometers. X-ray diffractometers, which are equipped with two-dimensional surface detectors, can refer to this method.
Basic Data
Standard ID
JY/T 0587-2020 (JY/T0587-2020)
Description (Translated English)
General rules for X-ray polycrystalline diffractometry
Sector / Industry
Education Industry Standard (Recommended)
Classification of Chinese Standard
Y51
Classification of International Standard
03.180
Word Count Estimation
33,395
Date of Issue
2020-09-29
Date of Implementation
2020-12-01
Issuing agency(ies)
Ministry of Education of the People's Republic of China
