Skip to product information
1 of 5

PayPal, credit cards. Download editable-PDF and invoice in 1 second!

JJF 1015-2014 English PDF (JJF1015-2014)

JJF 1015-2014 English PDF (JJF1015-2014)

Regular price $145.00 USD
Regular price Sale price $145.00 USD
Sale Sold out
Shipping calculated at checkout.
Quotation: In 1-minute, 24-hr self-service. Click here JJF 1015-2014 to get it for Purchase Approval, Bank TT...

JJF 1015-2014: General Norm for Pattern Evaluation of Measuring Instruments

This Norm is applicable to pattern evaluation of measuring instruments and approved pattern compliance examination.
JJF 1015-2014
NATIONAL METROLOGY TECHNICAL SPECIFICATION
OF THE PEOPLE'S REPUBLIC OF CHINA
Replacing JJF 1015-2002
General Norm for Pattern Evaluation of
Measuring Instruments
ISSUED ON: JANUARY 23, 2014
IMPLEMENTED ON: JULY 23, 2014
Issued by: General Administration of Quality Supervision, Inspection and Quarantine
General Norm for Pattern Evaluation
of Measuring Instruments
Replacing JJF 1015-2002
Jurisdiction organization: National Technical Committee of Legal Metrology Metering Management
Drafting organizations: Beijing Institute of Metrology Detection
Beijing Bureau of Quality and Technical Supervision
China National Institute of Metrology
This Norm is entrusted to National Technical Committee of Legal Metrology Metering Management for the interpretation.
Drafters of this Norm:
Wang, Zigang (Beijing Institute of Metrology Detection)
Chen, Jinghua (Beijing Bureau of Quality and Technical Supervision)
He, Zhao (China National Institute of Metrology).
Table of Contents
Foreword ... 5
1 Scope ... 7
2 Normative references ... 7
3 Terms and definitions ... 7
4 Technical information and test prototype that shall be submitted by the application organization ... 8
5 Pattern evaluation ... 9
6 Handling of test prototype ... 12
7 Handling of technical information ... 13
Annex A Pattern Evaluation Report Format ... 14
Annex B Format for ?€?Explanation?€? on Prototype Retention of Pattern Evaluation ... 19
Foreword
JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring
Instruments" is a guiding technical specification for pattern evaluation of measuring instruments.
JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring
Instruments" was modified on the basis of JJF 1015-2002 "General Norm for Pattern Evaluation and Pattern Approval of Measuring Instruments", which references to partial contents of No.19 "Pattern evaluation and pattern approval" of International Organization for Legal Metrology (OIML) and
combines with the relevant requirements proposed by the metrological
administrative department.
Compared with JJF 1015-2002, this Norm is only related to the pattern
evaluation of the measuring instruments. The pattern approval shall be
specified by relevant documents issued by the metrological administrative department. The main changes of this revision are as follows:
- Add terms "single product" and "series product" ( see 3.3 and 3.4 );
- Add "Application for Pattern Approval of Measuring Instruments that was accepted and entrusted by the government metrological administrative
department" in the submitted technical information (see 4.1);
- Make significant change in the submitted test prototype (see 4.2);
- Improve the approved pattern or specify the basis-change of the previous pattern evaluation (see 5.1);
- Refine the examination of technical information to make it more operatable (see 5.2);
- Divide the pattern evaluation into observation project and test project, so as easy for description (see 5.3 and 5.4);
- Add "function verification" (see 5.4.1);
- Refine "stability test" (see 5.4.7);
- Change the way of "determination of pattern evaluation result"; it shall be determined as qualified only when all the items for evaluation are qualified (see 5.5);
- Enrich the "pattern evaluation report" by requiring records and photos to be listed in the report as attachment (see 5.6);
- Change the handling of test prototype (see 6);
- Refine the "notices" of "pattern evaluation report" and specify 15-day appeal period (see Appendix A);
- Add tables of "measurement parameters for measuring instruments",
"critical parts and materials", "list of equipment for pattern evaluation" and "list of evaluation items and evaluation results";
- Delete contents relating to pattern approval;
- Delete basic safety test;
- Delete tests for adaptability of measuring performance in transport
simulation and retention simulation;
- Delete "handling for the first test failure".
The previous versions of this Norm are:
- JJF 1015-2002;
- JJF 1015-1990.
General Norm for Pattern Evaluation
of Measuring Instruments
1 Scope
This Norm is applicable to pattern evaluation of measuring instruments and approved pattern?€?s compliance examination.
2 Normative references
This Norm takes the following documents as reference:
JJF 1016-2014 The Rules for Drafting Program of Pattern Evaluation of
Measuring Instruments;
JJF 1051 Designation and Classification Code for Measuring Instruments; JJF 1069 Rules for the Examination of the Service of Legal Metrological Verification.
For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
3 Terms and definitions
Terms and definitions defined by JJF 1001 "General Terms in Metrology and Their Definitions" AND the following terms and definitions are applicable to this Norm.
3.1 Measuring instrument
The single device or combination with one or multiple auxiliary equipment, which are used for measuring.
3.2 Type (pattern) evaluation
The systematical examination and test on performance of one or multiple samples in specified pattern according to document requirements on measuring instruments, of which the results are written in the pattern evaluation report to confirm if the pattern can be approved.
Note: The pattern of measuring instruments refers to the prototype as well as its technical information (e.g., drawings, design material, software documents, etc.) of a certain measuring instrument.
3.3 Single product
The product of one specification or model.
3.4 Series product
A group of products with same measuring principle, same or similar structure (appearance), which meet one of the following conditions:
1) With same accuracy but with different measurement range;
2) With different accuracy but with same measuring range and structure. 4 Technical information and test prototype that shall
be submitted by the application organization
The applicant shall provide the technical information and test prototype required by pattern evaluation to the technical agency who undertakes the pattern evaluation.
4.1 Technical information
The following technical information shall be provided in two-sets by the applicant:
- "Application for Pattern Approval of Measuring Instruments" accepted and entrusted by the government metrological administrative department;
- Product standard;
- Assembly drawing, circuit diagram and critical parts list;
- Instructions for use;
- Test report made by manufacturer or technical agency;
- Explosion-proof certificate shall be provided if the test is carried out in the explosive environment;
- Software evaluation report (if the government metrological administrative department requires) issued by authorized agency.
4.2 Test prototype
The technical agency who undertakes the pattern evaluation shall require the applicant to provide the test prototype according to provisions of pattern evaluation outline if there is any; otherwise, determine the specification and quantity of the prototype according to provisions of 6.13 of JJF 1016-2014. 5 Pattern evaluation
5.1 General principles
The pattern evaluation shall be carried out according to the pattern evaluation outline.
The pattern evaluation includes technical information submitted for review, observation item evaluation, and editing of pattern evaluation report. Generally, the pattern evaluation shall be completed within 3 months. If there is stability test of the measuring instrument, the evaluation period can be appropriately extended; however, it shall be stated in advance to the government metrological administrative department who entrusts the pattern evaluation and to the applicant.
If the basis of the previous pattern evaluation is changed, it shall re-evaluate or partially evaluate according to the requirements in the foreword of new pattern evaluation outline. It shall review the approved pattern that has been improved. The items for evaluation shall be determined by the technical agency who undertakes the pattern evaluation according to the specific improvement. 5.2 Review of technical information
5.2.1 Comparing with 4.1 of this Norm, review if the technical information is complete.
5.2.2 Review if the units of measurement, the external structure, marks, anti- spoofing measures, etc. are in line with the legal management requirements. Meanwhile, review if the names of measuring instruments comply with
provisions of JJF 1051 and the "Catalogue of Measuring Instruments under the Legal Administration of the People's Republic of China (Pattern Approval)." 5.2.3 Review if the product standard of which this Norm is based on,
measurement indicators, functions and technologies in the user manual meet the requirements of the pattern evaluation outline.
5.2.4 The technical information that are reviewed as qualified shall be marked with paging seal as review confirmation. The review organization, reviewer, review date as well as pattern evaluation report number shall be indicated on the mark. Return the unqualified technical information for review to the applicant. Resubmit for review after modification by the applicant.
5.3 Observation item evaluation
Evaluate the items requiring no test in legal management requirements,
metering requirements and common technical requirements proposed by the pattern evaluation outline, and fill the observation record table with evaluation conclusion of each item.
5.4 Evaluation of test item
It shall record test data and test results of the following tests.
5.4.1 Function verification
Verify if the measuring instrument is equipped with each function specified in the pattern evaluation outline, and if each function meets the requirements. 5.4.2 Test of measuring function
Carry out the test under reference conditions specified in the pattern evaluation outline.
5.4.3 Test of climate adaptation
Respectively carry out the test under the upper and lower rated points in the climatic environment specified in the pattern evaluation outline.
5.4.4 Test of mechanical environment adaptation
Carry out the test under the mechanical environment specified in the pattern evaluation outline.
5.4.5 Test of electromagnetic environment adaptation (immunity)
Carry out the test under the electromagnetic environment specified in the pattern evaluation outline.
5.4.6 Test of power environment adaptation
Carry out the test under the power environment specified in the pattern evaluation outline.
5.4.7 Stability test
Carry out the stability test according to provisions of the pattern evaluation outline.
5.4.7.1 Carry out the test of measuring performance under reference conditions. 5.4.7.2 Carry out the operation test. According to provisions of the pattern evaluation outline, operate for sufficient time or cumulants. Adjustments or changes are not allowed during prototype operation.
5.4.7.3 After the operation test is completed, carry out the test of measuring performance under reference conditions; check if the data changes of two tests comply with the requirements of the pattern evaluation outline.
5.5 Determination of pattern evaluation result
5.5.1 It is qualified when all the evaluation items of the prototype comply with the requirements of the pattern evaluation outline.
5.5.2 For single product, it shall be determined as unqualified if one or more items are unqualified.
5.5.3 For series product, according to 5.5.2, this series shall be determined as unqualified if one or more models are unqualified.
5.6 Issue of pattern evaluation report
After tests are completed, issue the pattern evaluation report according to the format requirements in Appendix A. Reports shall be respectively issued for series products with different measuring performance.
For qualified product, "The test prototype complies with requirements of pattern evaluation outline, and it is suggested that the pattern of measuring instruments of the following models is approved: ???????? and ????????" shall be indicated in "Pattern evaluation conclusion and suggestion" of pattern evaluation report. For unqualified product, "The ???????? of the test prototype fails to meet
requirements of ???????? pattern evaluation outline, and it is suggested that the pattern of measuring instruments of the following models is not approved: ???????? and ????????" shall be indicated in "Pattern evaluation conclusion and suggestion" of pattern evaluation report.
Retaining method and retaining quantity of the prototype shall be indicated in "Other notes" in the 8th part of the report.
The pattern evaluation report is composed of three parts: main body,
attachment 1 and attachment 2. The format of main body is shown in Appendix A. The main body shall contain information related to the applied measuring instrument pattern, as well as conclusion and suggestion drawn from
attachment 1. Attachment 1 is the record of objective circumstances observed and measured by the reviewer during pattern evaluation, of which the format is consistent with the record format of referenced pattern evaluation outline. If there are more than one test prototypes, the reports shall be respectively stated as attachment 1-1, attachment 1-2 to attachment 1-n. Attachment 2 contains photos (shall not be less than 4) taken by the technical agency after the pattern evaluation is completed, and the mark is pasted on the prototype. This group of photos shall include the overall shape, internal structure, display section, critical components of the prototype. Page numbers shall be noted in the page footer of the report as "page ?? of ??".
The format of the observation record in attachment 1 is shown in item "two" of JJF 1016-2014's Appendix A. The format of test item is same as the one of test record specified by pattern evaluation outline of this measuring instrument. 5.7 Handling of unqualified pattern evaluation
When the audited technical information is found non-conformance, it shall inform the applicant to conduct rectification.
When there is unqualified item in the test, if the conditions of prototype permit, the technical agency shall proceed the test till all test is completed. Otherwise, the technical agency shall stop if the test is unable to be continued due to unqualified item of prototype.
5.8 Confidentiality of prototype and technical information
The technical agency shall keep the prototype, technical information and evaluation results confidential according to requirements of JJF 1069 during pattern evaluation and after pattern evaluation.
6 Handling of test prototype
6.1 Handling of qualified prototype
6.1.1 Seal and mark of prototype
The technical agency who undertakes the pattern evaluation shall make
effective seal and mark to the qualified prototype or critical components. The mark shall be obviously pasted and the mark format is shown in Appendix B. The seal and mark shall ensure the critical components and material of the prototype shall not be replaced or adjusted. The technical agency who
undertakes the pattern evaluation shall take photos of well-sealed and marked prototype. Characters on the mark shall be clearly shown in the photos. Photos are listed in the attachment 2 of the pattern evaluation report.
6.1.2 Prototype retention
In order to meet requirements for compliance examination of approved pattern, the technical agency who undertakes the pattern evaluation shall hand over the sealed and marked test prototype to the applicant. The applicant shall well store the sealed and marked test prototype till the fifth year after the production of this pattern of measuring instrument is stopped.
6.2 Handling of unqualified prototype
After pattern evaluation is completed, for unqualified prototypes, they shall be returned to the applicant after reconsideration period is over.
7 Handling of technical information
After the pattern evaluation is completed (qualified or unqualified), the technical information submitted by the applicant shall be handled in the following ways: One set shall be returned to the applicant while the other set shall be stored by the technical agency according to requirements of JJF 1069. The technical information for retention contains each kind of documents, pattern evaluation report and various of records.
Annex A
Pattern Evaluation Report Format
Pattern Evaluation Report of Measuring Instruments
(Designation and Classification Code for Measuring Instruments)
Report No.
(Name of Technical Agency)
Page x of x
I. Notices
1. This report shall be invalid if there is alteration, or without special-seal of pattern evaluation laboratory, or without signatures of pattern evaluator, reviewer and approver.
2. The copy of this report shall be invalid if there is no special-seal of pattern evaluation laboratory for a second time.
3. This report is composed of main body, attachment 1 and attachment 2. None of them is allowed to use alone.
4. If there is change in the referenced national technical specification, or the applicant makes changes to the approved pattern, the applicant shall apply for pattern re-evaluation in time.
5. When the applicant disagrees with this report, it shall submit a written application for reconsideration within 15 days of receipt of this report to the technical agency who undertakes the pattern evaluation or the government metrological administrative department who accepts the application;
otherwise, it shall be deemed that the conclusion of this report is accepted. II. Explanation
1. The report shall be printed on A4 paper;
2. This report is made of three originals that shall be kept by the technical agency, the applicant and the entrusting organization.
Page x of x
I. Basic information of application and entrustment
A. Manufacturer:
Applicant:
Agent:
B. Entrusting organization:
Entrusted date:
Entrusting responsible-person:
C. S/N of Application New-model??? Improved-model???
II. Basic information of pattern
A. Designation and classification code for measuring instruments
B. Standards and their numbers that are based by the working principles, usage, occasion for usage and production
C. Model, specification, accuracy grade / maximum permissible error /
uncertainty and number
D. Measurement parameters for measuring instruments
Serial
No.
Name of
measurement
parameter
Unit of
measurement
parameter
Measurement
range
Display
digit-
number
Measurement
performance
indicator
E. Display pattern Mechanical??? Electrical Mechanical??? Electronic???
F. Conditions of test environment
1. Temperature:
2. Relative humidity:
3. Power supply: Voltage Frequency Power Consumption
4. Others
Page x of x
G. Critical components and material
Name Model Manufacturer Main performance indicators Remark
III. Basis of pattern evaluation
IV. List of equipment for pattern evaluation
Serial No. Name of equipment No.
Validity of
certificate
V. List of pattern evaluation item and evaluation result
Serial No. Evaluation item + - Remark
Note:
+ -...

View full details