GB/T 4955-2005: Metallic coatings -- Measurement of coating thickness -- Coulometric method by anodic dissolution

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Scope

This document describes a coulometric method, by anodic dissolution, for measuring
the thickness of metallic coatings. It is only applicable to conductive coatings.
Typical combinations of coatings and substrates that can be tested by this method are
given in Table 1.Other combinations may be tested with electrolytes in current use (see
Annex A), or new electrolytes may be developed for them but, in both cases, it is
necessary to verify the suitability of the complete system.
This Standard is also applicable to multi-layer systems, e.g. Cu-Ni-Cr (see also 8.5).
It may be used to measure the thickness of coatings applied by various means, if due
account is taken of special features such as the presence of an alloy layer. In some cases,
the presence and thickness of diffusion layers can also be measured. It can also be used
to measure the thickness of coatings on cylindrical specimens and wires (see 8.7).

Basic Data

Standard ID	GB/T 4955-2005 (GB/T4955-2005)
Description (Translated English)	Metallic coatings. Measurement of coating thickness. Coulometric method by anodic dissolution
Sector / Industry	National Standard (Recommended)
Classification of Chinese Standard	A29
Classification of International Standard	25.220.20
Word Count Estimation	15,192
Date of Issue	2005-10-12
Date of Implementation	2006-04-01
Older Standard (superseded by this standard)	GB/T 4955-1997
Quoted Standard	GB/T 3138; GB/T 12334
Adopted Standard	ISO 2177-2003, IDT
Regulation (derived from)	Announcement of Newly Approved National Standards 2006 No. 1 (No. 88 overall)
Issuing agency(ies)	General Administration of Quality Supervision, Inspection and Quarantine of the People Republic of China, China National Standardization Administration Committee
Summary	This standard specifies the measurement of the thickness of the metal coating layer anode melting coulometry. Law for the conductive cover layer only. This standard also applies to multi-layered system of measurement, such as Cu-Ni-Cr (see 8. 5).