Skip to product information
1 of 6

PayPal, credit cards. Download editable-PDF & invoice in 1 second!

GB/T 38976-2020 English PDF (GBT38976-2020)

GB/T 38976-2020 English PDF (GBT38976-2020)

Regular price $110.00 USD
Regular price Sale price $110.00 USD
Sale Sold out
Shipping calculated at checkout.
Delivery: 3 seconds (Download full-editable-PDF + Invoice).
Quotation: Click GB/T 38976-2020>>Add to cart>>Quote
Editable-PDF Preview (Reload if blank, scroll for next page)

See Chinese contents: GB/T 38976-2020
GB/T 38976-2020: Test method for the oxygen concentration in silicon materials--Inert gas fusion infrared detection method
This Standard specifies the method that uses inert gas melting and infrared technology to test the oxygen concentration in silicon materials. This Standard is applicable to the tests of oxygen content in silicon single crystal and polycrystalline silicon with different conductivity types and different resistivity ranges. The test range is 2.5??1015cm-3 (0.05ppma) ~ 2.5??1018cm-3 (50ppma).

Read this Google-Book: GB/T 38976-2020
Buy this Google-Book: GB/T 38976-2020
Germany Google-Book: GB/T 38976-2020
Japan Google-Book: GB/T 38976-2020
Korea Google-Book: GB/T 38976-2020

View full details