GB/T 34986-2017 English PDF (GBT34986-2017)

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GB/T 34986-2017: Methods for product accelerated testing
GB/T 34986-2017
NATIONAL STANDARD OF THE
PEOPLE’S REPUBLIC OF CHINA
ICS 03.120.01;03.120.30
L 05
GB/T 34986-2017 / IEC 62506:2013
Methods for product accelerated testing
(IEC 62506:2013, IDT)
ISSUED ON: NOVEMBER 01, 2017
IMPLEMENTED ON: MAY 01, 2018
Issued by: General Administration of Quality Supervision, Inspection and
Quarantine;
Standardization Administration of the People’s Republic of China.
Table of Contents
Foreword ... 4 
Introduction ... 6 
1 Scope ... 8 
2 Normative references ... 8 
3 Terms, definitions, symbols and abbreviations ... 9 
3.1 Terms and definitions ... 9 
3.2 Symbols and abbreviated terms ... 11 
4 General description of the accelerated test methods ... 13 
4.1 Cumulative damage model ... 13 
4.2 Classification, methods and types of test acceleration ... 15 
5 Accelerated test models ... 19 
5.1 Type A: qualitative accelerated tests ... 19 
5.2 Type B and C: Quantitative accelerated test methods ... 27 
5.3 Failure mechanisms and test design ... 32 
5.4 Determination of stress levels, profiles and combinations in use and test – stress
modelling ... 33 
5.5 Multiple stress acceleration methodology – Type B tests ... 33 
5.6 Single and multiple stress acceleration for Type B tests ... 36 
5.7 Acceleration of quantitative reliability tests ... 48 
5.8 Accelerated reliability compliance or evaluation tests ... 57 
5.9 Accelerated reliability growth testing ... 59 
5.10 Guidelines for accelerated testing ... 60 
6 Accelerated testing strategy in product development ... 61 
6.1 Accelerated testing sampling plan ... 61 
6.2 General discussion about test stresses and durations ... 62 
6.3 Testing components for multiple stresses ... 63 
6.4 Accelerated testing of assemblies ... 63 
6.5 Accelerated testing of systems ... 63 
6.6 Analysis of test results ... 64 
7 Limitations of accelerated testing methodology ... 64 
Annex A (informative) Highly accelerated limit test (HALT) ... 66 
Annex B (informative) Accelerated reliability compliance and growth test design ... 71 
Annex C (informative) Comparison between HALT and conventional accelerated
testing ... 88 
Annex D (informative) Estimating the activation energy, Ea ... 89 
Annex E (informative) Calibrated accelerated life testing (CALT) ... 91 
Annex F (informative) Example on how to estimate empirical factors ... 94 
Annex G (informative) Determination of acceleration factors by testing to failure ... 99 
Bibliography... 103 
Foreword
This Standard was drafted in accordance with the rules given in GB/T 1.1-2009.
This Standard uses the translation method to equivalently adopt IEC 62506:2013
“Methods for product accelerated testing”.
The documents of our country that have a consistent correspondence with the
international documents that are referenced in this Standard are as follows:
-- GB/T 5080.1-2012, Reliability testing - Part 1: Test conditions and statistical test
principles (IEC 60300-3-5:2001, IDT)
This Standard, compared with IEC 62506:2013, makes the following editorial changes:
-- “a minimum 30 000 h per year” in the original text 5.2.3.1.3 is wrong; it shall be
“a minimum 3 000 h per year”;
-- “as the time compression may influence the stress acceleration” in the original text
5.2.3.2.1 is wrong; it shall be “as the event compression may influence the stress
acceleration”;
-- “Equation (3) presents a rather accurate way of expressing the overall item failure
rate with applied stresses” in the original text 5.5 is wrong; it shall be “Equation
(4) presents a rather accurate way of expressing the overall item failure rate with
applied stresses";
-- “n1/N1”, “l1/L1” and “αi is the time at the ith stress level” in the original text 5.6.3.2
are wrong; they shall be “ni/Ni”, “li/Li” and “αi is the ratio of the time at the ith
stress level to the life under applied loads”;
-- S in equation (B.22) in the original Annex B shall be NS;
-- “One in this group failed after 700 cycles and 10 after 1000 cycles.” and “In this
second test group B, 4 failed after 300 cycles, 10 after 400 cycles, and additional
5 after 500 cycles” in Annex F of the original text are wrong; they shall be “One
in this group failed after 700 cycles and 3 after 1 000 cycles.” and “In this second
test group B, 5 failed after 300 cycles, 10 after 400 cycles, and additional 5 after
500 cycles.”;
-- “265V” in Figure G.1 of Annex G of the original text is wrong; it shall be “25V”;
the curve fitting equation, equation (G.1) and equation (G.2) in Figure G.2 are
wrong and corrected.
This Standard was proposed by the Ministry of Industry and Information Technology
of the People's Republic of China.
Methods for product accelerated testing
1 Scope
This standard provides guidance on the application of various accelerated test
techniques for measurement or improvement of product reliability. Identification of
potential failure modes that could be experienced in the use of a product/item and their
mitigation is instrumental to ensure dependability of an item.
The object of the methods is to either identify potential design weakness or provide
information on item dependability, or to achieve necessary reliability/availability
improvement, all within a compressed or accelerated period of time. This standard
addresses accelerated testing of non-repairable and repairable systems. It can be used
for probability ratio sequential tests, fixed duration tests and reliability
improvement/growth tests, where the measure of reliability may differ from the
standard probability of failure occurrence.
This standard also extends to present accelerated testing or production screening
methods that would identify weakness introduced into the product by manufacturing
error, which could compromise product dependability.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this
document and are indispensable for its application. For dated references, only the
edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
IEC 60068 (all parts), Environmental testing
IEC 60300-3-1:2003, Dependability management – Part 3-1: Application guide –
Analysis techniques for dependability – Guide on methodology
IEC 60300-3-5, Dependability management – Part 3-5: Application guide –
Reliability test conditions and statistical test principles
IEC 60605-2, Equipment reliability testing – Part 2: Design of test cycles
IEC 60721 (all parts), Classification of environmental conditions
IEC 61014:2003, Programmes for reliability growth
IEC 61164:2004, Reliability growth – Statistical test and estimation methods
IEC 61124:2012, Reliability testing – Compliance tests for constant failure rate and
constant failure intensity
IEC 61163-2, Reliability stress screening – Part 2: Electronic components
IEC 61649:2008, Weibull analysis
IEC 61709, Electronic components – Reliability – Reference conditions for failure
rates and stress models for conversion
IEC 61710, Power law model – Goodness-of-fit tests and estimation methods
IEC 62303, Radiation protection instrumentation – Equipment for monitoring
airborne tritium
IEC/TR 62380, Reliability data handbook – Universal model for reliability
prediction of electronics components, PCBs and equipment
IEC 62429, Reliability growth – Stress testing for early failures in unique complex
systems ...