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GB/T 31854-2015 English PDF (GBT31854-2015)

GB/T 31854-2015 English PDF (GBT31854-2015)

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GB/T 31854-2015: Test method for measuring metallic impurities content in silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry
This standard specifies a method for the determination of trace metal impurities in silicon materials for photovoltaic applications by inductively coupled plasma mass spectrometry (ICP-MS). This standard applies to the determination of trace metal impurities of iron, chromium, nickel, copper, zinc in silicon materials for photovoltaic applications.

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