GB/T 17626.5-2019 English PDF (GB/T17626.5-2019)

GB/T 17626.5-2019: Electromagnetic compatibility - Testing and measurement techniques - Surge immunity test
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GB/T 17626.5-2019
Electromagnetic compatibility Test -- Testing and measurement techniques -- Surge immunity test
ICS 33.100.20
L06
National Standards of People's Republic of China
Replace GB/T 17626.5-2008
Electromagnetic compatibility test and measurement technology
Surge (impact) immunity test
Published on.2019-06-04
2020-01-01 implementation
State market supervision and administration
China National Standardization Administration issued
Content
Foreword I
1 range 1
2 Normative references 1
3 Terms, definitions and abbreviations 1
4 Overview 5
5 Test level 5
6 Test equipment 6
7 test configuration 18
8 Test procedure 20
9 Evaluation of test results 21
10 Test report 22
Appendix A (Normative Appendix) Surge Test for Unshielded Outdoor Symmetric Communication Lines Interconnected with Widely Distributed Systems 23
Appendix B (informative) Signal generator and test level selection 29
Appendix C (informative) Notes 32
Appendix D (informative) What to consider when implementing equipment that is connected to a low-voltage power system
Appendix E (informative) Mathematical model of surge waveforms 36
Appendix F (informative) Considerations for measurement uncertainty 44
Appendix G (informative) Calibration method for pulse measurement systems 51
Appendix H (informative) Coupling/decoupling method for applying surges to rated supply currents greater than.200A.
Reference 55
Foreword
GB/T 17626 "Electromagnetic Compatibility Test and Measurement Technology" is divided into the following parts.
--- Part 1. General overview of immunity test;
--- Part 2. Electrostatic discharge immunity test;
--- Part 3. Radio frequency electromagnetic field radiation immunity test;
--- Part 4. Electrical fast transient burst immunity test;
---Part 5. Surge (impact) immunity test;
--- Part 6. Conducted disturbance immunity of RF field induction;
--- Part 7. Guidelines for the measurement and measurement of harmonics and interharmonics of power supply systems and connected equipment;
---Part 8. Power frequency magnetic field immunity test;
---Part 9. Pulse magnetic field immunity test;
--- Part 10. Damping oscillating magnetic field immunity test;
--- Part 11. Voltage dips, short-term interruptions and voltage change immunity tests;
--- Part 12. Ringing wave immunity test;
--- Part 13. AC power port harmonics, interharmonics and low frequency immunity test of grid signals;
--- Part 14. Voltage fluctuation immunity test;
--- Part 15. Scintillator function and design specifications;
--- Part 16. 0Hz ~ 150kHz common mode conducted disturbance immunity test;
--- Part 17. Ripple immunity test of DC power input port;
---Part 18. Damping oscillator wave immunity test;
--- Part 20. Emission and immunity tests in transverse electromagnetic (TEM) waveguides;
--- Part 21. Mixing chamber test method;
--- Part 22. Radiated emissions and immunity measurements in full anechoic chambers;
--- Part 24. Test methods for HEMP conducted disturbance protection devices;
--- Part 27. Three-phase voltage unbalance immunity test;
--- Part 28. Power frequency change immunity test;
--- Part 29. DC power supply input port voltage dip, short-term interruption and voltage change immunity test;
--- Part 30. Power quality measurement methods;
--- Part 34. Voltage sag, short-term interruption and voltage change immunity test of equipment with main current per phase greater than 16A.
This part is the fifth part of GB/T 17626.
This part is drafted in accordance with the rules given in GB/T 1.1-2009.
This part replaces GB/T 17626.5-2008 "Electromagnetic compatibility test and measurement technology surge (impact) immunity test". versus
Compared with GB/T 17626.5-2008, the main technical changes are as follows.
--- Removed some of the referenced documents (see Chapter 2, Chapter 2 of the.2008 edition);
--- Added 3 new definitions (see 3.1.6, 3.1.11 and 3.1.15) and modified 2 definitions (see 3.1.8, 3.1.14,.2008)
3.7, 3.15);
--- Added abbreviations (see 3.2);
--- Increased the test level of line-line and line-ground (see Table 1, Table 1 of the.2008 version);
--- Modified the definition of the 1.2/50μs-8/20μs waveform parameters (see Table 2, Table 2 of the.2008 version);
--- Added a description of the calibration method for generator characteristics (see 6.2.3);
--- Removed the description of the 10/700μs combined wave generator (see Chapter 6, 6.2 of the.2008 version);
--- Modified the selection flow chart of the coupling/decoupling network (see Figure 4, 6.3 of the.2008 version);
--- Modified the requirements for CDN for AC/DC power supplies, adding open circuit voltage peaks for EUT ports of CDN
Relationship with the peak value of the short-circuit current (see 6.3.2, 6.3.1 of the.2008 version);
--- Added calibration on CDN (see 6.4);
--- Removed the description of the test configuration of the high-speed communication line (see Chapter 7, 7.5 of the.2008 version);
--- Removed the description of the test configuration for applying the potential difference (see Chapter 7,.2008 for 7.7);
--- Removed a description of the working status of the EUT (see Chapter 7, 7.8 of the.2008 version);
--- Added special instructions for surge test connected to external communication cable ports, in particular, specified 10/700μs combined wave
The technical parameters of the generator (see Appendix A, 6.2 of the.2008 version);
--- Added a mathematical model of the surge waveform (see Appendix E);
--- Added considerations about measurement uncertainty (see Appendix F);
--- Added calibration method for pulse measurement systems (see Appendix G);
--- Added coupling/decoupling method for applying surges to rated currents greater than.200A (see Appendix H).
This section uses the translation method equivalent to IEC 61000-4-5.2014 Electromagnetic Compatibility (EMC) Part 4-5. Test and Measurement Techniques
Surge (impact) immunity test.
The documents of our country that have a consistent correspondence with the international documents referenced in this part are as follows.
---GB/T 2900 (all parts) Electrical terminology [IEC 60050 (all parts)].
This section has made the following editorial changes.
--- The standard name was changed to "Electromagnetic Compatibility Test and Measurement Technology Surge (Impact) Immunity Test";
--- Amend the footnote a of Table 5 in the case of "open circuit" to "in the case of a short circuit";
--- Correct the figure "Line L2-line L3" in Figure 7 as "Line L3-line L2";
--- Correct the connection point of the combined wave generator to the coupling network in Figure 9, Figure 10, Figure A.4;
--- Amendment 7.1 "as described in 7.6.2 and Figure 12" is "as 7.6 and Figure 12";
--- Correct the "Tw" in Figure E.2 to "T";
--- Amend the F.4.6 "a reasonable value of α can be given the minimum value given in Table 1" as "a reasonable value of α can be used in Table F.4
The minimum value given in "";
--- Correct the "V'(tp)=0" in F.4.7 to "V'in(tp)=0".
This part is proposed and managed by the National Electromagnetic Compatibility Standardization Technical Committee (SAC/TC246).
This section drafted by. China Electronics Technology Standardization Institute, Suzhou Taisite Electronic Technology Co., Ltd., Beijing Fu Test Electronic Instrument
Co., Ltd., China Institute of Metrology, Lenovo (Beijing) Co., Ltd., Shanghai Institute of Metrology and Testing Technology, China Automotive Technology Research
Center Ltd.
The main drafters of this section. Li Huanran, Zhang Qiang, Randford, Huang Pan, Lu Feiyan, Zhao Wenhui, Ding Yifu, Huang Xuejun, Ye Chang, Hou Xinwei.
The previous versions of the standards replaced by this section are.
---GB/T 17626.5-1999, GB/T 17626.5-2008.
Electromagnetic compatibility test and measurement technology
Surge (impact) immunity test
1 Scope
This part of GB/T 17626 specifies the immunity of equipment to unipolar surges (shocks) caused by switches and lightning transients.
The requirements, test methods and recommended test level ranges specify several test levels for different environments and installation conditions. Presented in this section
Requirements apply to electrical and electronic equipment.
The purpose of this section is to establish a common benchmark to evaluate the performance of electrical and electronic equipment in the event of a surge (impact). Headquarters
A uniform test method is defined to assess the immunity of equipment or systems to specified phenomena.
Note. As described in IEC Guide 107, this section is the basic EMC standard for use by product committees. IEC Guide 107 also specifies that product committee members
It is the responsibility of determining whether or not to apply this immunity test standard. If used, it is responsible for determining the appropriate test level and performance criteria. National Electromagnetic Compatibility
The Standardization Technical Committee and its sub-technical committees are willing to work with product committees to evaluate the special immunity requirements of their products.
This section specifies.
---The scope of the test level;
---Test equipment;
---Test configuration;
---Test procedure.
The task of testing in the laboratory is to find out the surge (rushing) caused by the switch or lightning during the specified working condition of the equipment.
Hit the voltage response.
This part does not test the insulation capacity of the equipment under test. This section does not consider the direct injection of lightning current for direct lightning strikes.
2 Normative references
The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article.
Pieces. For undated references, the latest edition (including all amendments) applies to this document.
IEC 60050 (all parts) International Electrotechnical Vocabulary
3 Terms, definitions and abbreviations
3.1 Terms and definitions
The following terms and definitions as defined by IEC 60050 apply to this document.
3.1.1
Avalanche device avalanchedevice
A diode, gas discharge tube, or other component that breaks down and conducts at a specified voltage.
3.1.2
Calibration calibration
A set of operations that establish a relationship between the labeled value and the measured result according to the reference standard under the specified conditions with reference to the standard.
Note 1. This term is used in the “uncertainty” approach.
Note 2. In principle, the relationship between the marked value and the measured result can be represented by a calibration chart.
[GB/T 2900.77-2008, definition 311-01-09]
3.1.3
Clamping device clampingdevice
A diode, (pressure sensitive) resistor or other component that prevents the applied voltage from exceeding a specified value.
3.1.4
Combined wave generator combinationwavegenerator; CWG
Can generate 1.2/50μs open circuit voltage waveform, 8/20μs short circuit current waveform or 10/700μs open circuit voltage waveform, 5/320μs short circuit
Generator for current waveforms.
3.1.5
Coupling network couplingnetwork;CN
A circuit that transfers energy from one circuit to another.
3.1.6
Coupling/decoupling network coupling/decouplingnetwork; CDN
A combination of a coupled network and a decoupled network.
3.1.7
Decoupling network decouplingnetwork; DN
A circuit used to prevent surges (impacts) applied to a device under test from affecting other non-test devices, devices, or systems.
3.1.8
Duration duration
3.1.8.1
Duration duration
Td
< 1.2/50μs surge voltage> The surge voltage rises from half to the peak voltage to half of the peak voltage.
Time interval (Tw).
Td=Tw
See Figure 2 and Figure A.2.
3.1.8.2
Duration duration
Td
< 8/20μs surge current> virtual parameter, defined as one of the inrush current from rising to half of the peak current to one of the peak current
Half, the time interval between the two (Tw), multiplied by 1.18.
Td=1.18×Tw
See Figure 3.
3.1.8.3
Duration duration
Td
< 5/320μs surge current waveform>Inrush current from rising to half of peak current to half of peak current, both
Interval (Tw).
Td=Tw
See Figure A.3.
3.1.9
Effective output impedance effectiveoutputimpedance
The ratio of the open circuit voltage peak to the peak value of the short circuit current at the same output (of the surge generator).
3.1.10
Electrical equipment electricalinstalation
A combination of related electrical devices with the inter-coordinated characteristics required to achieve a particular purpose.
[GB/T 2900.71-2008, definition 826-10-01]
3.1.11
Wavefront time fronttime
3.1.11.1
Wavefront time fronttime
Tf
< surge voltage> A virtual parameter of 1.67 times the time interval T between the 30% peak and the 90% peak.
See Figure 2 and Figure A.2.
3.1.11.2
Wavefront time fronttime
Tf
< Inrush Current> A virtual parameter that is 1.25 times the time interval T between the 10% peak and the 90% peak.
See Figure 3 and Figure A.3.
3.1.12
High-speed communication line high-speedcommunicationlines
Input/output lines with a transmission frequency greater than 100 kHz during operation.
3.1.13
Immunity immunity
The ability of a device, device, or system to experience electromagnetic disturbances without degrading operational performance.
[GB/T 4365-2003, definition 161-01-20]
3.1.14
Interconnection lines
The secondary circuit (isolated from the AC mains supply) is not affected by transient overvoltages (for example, capacitively grounded with reliable grounding)
Current secondary circuit, whose peak-to-peak ripple is less than 10% of the DC component, I/O line (input/output line) and/or communication line, and/or low voltage
DC input/output line (≤60V).
3.1.15
Power port powerport
A port for a wire or cable that provides power to the device or related device to function properly.
3.1.16
Protect primary protection once
Measures to prevent most of the surge (shock) energy from propagating through a specified interface.
3.1.17
Reference ground
The portion of the earth that is...