GB/T 17626.4-2018 English PDF (GBT17626.4-2018)

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GB/T 17626.4-2018: Electromagnetic compatibility -- Testing and measurement techniques -- Electrical fast transient/burst immunity test
GB/T 17626.4-2018
Electromagnetic compatibility--Testing and measurement techniques--Electrical fast transient/burst immunity test
ICS 33.100.20
L06
National Standards of People's Republic of China
Replace GB/T 17626.4-2008
Electromagnetic compatibility test and measurement technology
Electrical fast transient burst immunity test
[IEC 61000-4-4.2012, Electromagneticcompatibility (EMC)-
Part 4-4. Testingandmeasurementtechniques-
Electricalfasttransient/burstimmunitytest, IDT]
2018-06-07 released.2019-01-01 implementation
State market supervision and administration
China National Standardization Administration issued
Content
Foreword I
1 range 1
2 Normative references 1
3 Terms and definitions, abbreviations 1
3.1 Terms and Definitions 1
3.2 Abbreviations 3
4 Overview 3
5 Test level 4
6 Test equipment 4
6.1 Overview 4
6.2 Pulse group generator 4
6.3 AC/DC Power Port Coupling/Decoupling Network 7
6.4 Capacitive coupling clip 9
7 Test arrangement 11
7.1 Overview 11
7.2 Test equipment 11
7.3 Test arrangement for laboratory type tests 13
7.4 Test setup for field trials 16
8 Test procedure 18
8.1 Overview 18
8.2 Laboratory Reference Conditions 18
8.3 Conducting the test 19
9 Evaluation of test results 19
10 Test report 19
Appendix A (informative) Information on electrical fast transients 21
Appendix B (informative) Selection of test grades 23
Appendix C (informative) Considerations for measurement uncertainty 24
Reference 31
Foreword
GB/T 17626 "Electromagnetic Compatibility Test and Measurement Technology" currently includes the following parts.
---GB/T 17626.1-2006 Electromagnetic compatibility test and measurement technology immunity test;
---GB/T 17626.2-2018 Electromagnetic compatibility test and measurement technology Electrostatic discharge immunity test;
---GB/T 17626.3-2016 Electromagnetic compatibility test and measurement technology RF electromagnetic field radiation immunity test;
---GB/T 17626.5-2008 Electromagnetic compatibility test and measurement technology surge (impact) immunity test;
---GB/T 17626.6-2017 Electromagnetic compatibility test and measurement technology Conducted disturbance immunity of RF field induction;
---GB/T 17626.7-2008 Electromagnetic compatibility test and measurement technology Power supply system and connected equipment harmonic and interharmonic wave measurement
Guidance for quantity and measuring instruments;
---GB/T 17626.8-2006 Electromagnetic compatibility test and measurement technology power frequency magnetic field immunity test;
---GB/T 17626.9-2011 Electromagnetic compatibility test and measurement technology pulse magnetic field immunity test;
---GB/T 17626.10-2017 Electromagnetic compatibility test and measurement technology damping magnetic field immunity test;
---GB/T 17626.11-2008 Electromagnetic compatibility test and measurement technology resistance to voltage dips, short interruptions and voltage changes
Disturbance test
---GB/T 17626.12-2013 Electromagnetic compatibility test and measurement technology ringing wave immunity test;
---GB/T 17626.13-2006 Electromagnetic compatibility test and measurement technology AC power port harmonics, interharmonics and grid letters
Low frequency immunity test;
---GB/T 17626.14-2005 Electromagnetic compatibility test and measurement technology voltage fluctuation immunity test;
---GB/T 17626.15-2011 Electromagnetic compatibility test and measurement technology scintillator function and design specifications;
---GB/T 17626.16-2007 Electromagnetic compatibility test and measurement technology 0Hz~150kHz common mode conducted disturbance immunity
test;
---GB/T 17626.17-2005 Electromagnetic compatibility test and measurement technology DC power input port ripple immunity test;
---GB/T 17626.18-2016 Electromagnetic compatibility test and measurement technology damping oscillatory wave immunity test;
---GB/T 17626.20-2014 Electromagnetic Compatibility Test and Measurement Technology Emission and Immunity in Transverse Electromagnetic Wave (TEM) Waveguides
Degree test
---GB/T 17626.21-2014 Electromagnetic compatibility test and measurement technology mixing chamber test method;
---GB/T 17626.22-2017 Electromagnetic compatibility test and measurement technology Radiation emission and immunity in full anechoic chamber
measuring;
---GB/T 17626.24-2012 Electromagnetic compatibility test and measurement technology Test of HEMP conducted disturbance protection device
method;
---GB/T 17626.27-2006 Electromagnetic compatibility test and measurement technology three-phase voltage unbalance immunity test;
---GB/T 17626.28-2006 Electromagnetic compatibility test and measurement technology power frequency change immunity test;
---GB/T 17626.29-2006 Electromagnetic compatibility test and measurement technology DC power input port voltage sag, short-term
Immunity test for breaking and voltage changes;
---GB/T 17626.30-2012 Electromagnetic compatibility test and measurement technology power quality measurement method;
---GB/T 17626.34-2012 Electromagnetic compatibility test and measurement technology for main power supply per phase current greater than 16A
Voltage dip, short interruption and voltage variation immunity test.
This part is the fourth part of GB/T 17626.
This part is drafted in accordance with the rules given in GB/T 1.1-2009.
This part replaces GB/T 17626.4-2008 "Electromagnetic Compatibility Test and Measurement Technology Electrical Fast Transient Burst Immunity Test".
Compared with GB/T 17626.4-2008, the main technical changes are as follows.
--- Removed the reference standard IEC 60050-300..2001, International Electrotechnical Vocabulary Electrical and Electronic Measurement and Measurement Instruments 311
Part. General terms relating to measurement; Part 312. General terms relating to electrical measurements; Part 313. Electrical measurements
Type of gauge; Section 314. Specific terms based on gauge type (see Chapter 2);
---Added 1 term and definition (see 3.1.1);
--- Added abbreviations (see 3.2);
--- Removed the main components of the test generator (see 6.2.1);
--- Increased the calculation formula of Figure 3 and the ideal waveform (see 6.2.2);
--- Removed the "single pulse waveform of Figure 3 connected to 50Ω load", adding the "single pulse of Figure 3 output to 50Ω load
Think of the waveform (see Figure 3 of 6.2.2)";
--- Added the calibration content of the 6.4.2 capacitive coupling clip, adding Figure 7, Figure 8 (see 6.4.2);
--- Added 7.2.2 test instrument verification (see 7.2.2);
--- Add the label after the capacitive coupling clip in Figure 11 (see Figure 11);
--- Modified the test arrangement of the top entry device, added Figure 13 (see Figure 7.2.2 Figure 13);
--- Removed Figure 12, added Figure 15 (see Figure 7.4.2 Figure 15);
--- Added Appendix C information on measurement uncertainty (see Appendix C);
--- Removed 1 of Table C.1 and Table C.2 of Appendix C (see Appendix C, Table C.1 and Table C.2);
--- Revised Appendix C Table C.1 where A is α and in Appendix C there is no A (see Appendix C, Table C.1).
This section uses the translation method equivalent to IEC 61000-4-4.2012 Electromagnetic Compatibility (EMC) Part 4-4. Test and Measurement Techniques
Electrical fast transient burst immunity test.
This section has made the following editorial changes.
--- In line with the existing standard series, change the name of this part to "Electromagnetic Compatibility Test and Measurement Technology Electric Fast Transient Burst Group
Im...