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GB/T 17626.4-2018 English PDF (GBT17626.4-2018)

GB/T 17626.4-2018 English PDF (GBT17626.4-2018)

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GB/T 17626.4-2018: Electromagnetic compatibility -- Testing and measurement techniques -- Electrical fast transient/burst immunity test

GB/T 17626.4-2018
Electromagnetic compatibility--Testing and measurement techniques--Electrical fast transient/burst immunity test ICS 33.100.20
L06
National Standards of People's Republic of China
Replace GB/T 17626.4-2008
Electromagnetic compatibility test and measurement technology
Electrical fast transient burst immunity test
[IEC 61000-4-4.2012, Electromagneticcompatibility (EMC)-
Part 4-4. Testingandmeasurementtechniques-
Electricalfasttransient/burstimmunitytest, IDT]
2018-06-07 released.2019-01-01 implementation
State market supervision and administration
China National Standardization Administration issued
Content
Foreword I
1 range 1
2 Normative references 1
3 Terms and definitions, abbreviations 1
3.1 Terms and Definitions 1
3.2 Abbreviations 3
4 Overview 3
5 Test level 4
6 Test equipment 4
6.1 Overview 4
6.2 Pulse group generator 4
6.3 AC/DC Power Port Coupling/Decoupling Network 7
6.4 Capacitive coupling clip 9
7 Test arrangement 11
7.1 Overview 11
7.2 Test equipment 11
7.3 Test arrangement for laboratory type tests 13
7.4 Test setup for field trials 16
8 Test procedure 18
8.1 Overview 18
8.2 Laboratory Reference Conditions 18
8.3 Conducting the test 19
9 Evaluation of test results 19
10 Test report 19
Appendix A (informative) Information on electrical fast transients 21
Appendix B (informative) Selection of test grades 23
Appendix C (informative) Considerations for measurement uncertainty 24
Reference 31
Foreword
GB/T 17626 "Electromagnetic Compatibility Test and Measurement Technology" currently includes the following parts. ---GB/T 17626.1-2006 Electromagnetic compatibility test and measurement technology immunity test; ---GB/T 17626.2-2018 Electromagnetic compatibility test and measurement technology Electrostatic discharge immunity test; ---GB/T 17626.3-2016 Electromagnetic compatibility test and measurement technology RF electromagnetic field radiation immunity test; ---GB/T 17626.5-2008 Electromagnetic compatibility test and measurement technology surge (impact) immunity test; ---GB/T 17626.6-2017 Electromagnetic compatibility test and measurement technology Conducted disturbance immunity of RF field induction; ---GB/T 17626.7-2008 Electromagnetic compatibility test and measurement technology Power supply system and connected equipment harmonic and interharmonic wave measurement Guidance for quantity and measuring instruments;
---GB/T 17626.8-2006 Electromagnetic compatibility test and measurement technology power frequency magnetic field immunity test; ---GB/T 17626.9-2011 Electromagnetic compatibility test and measurement technology pulse magnetic field immunity test; ---GB/T 17626.10-2017 Electromagnetic compatibility test and measurement technology damping magnetic field immunity test; ---GB/T 17626.11-2008 Electromagnetic compatibility test and measurement technology resistance to voltage dips, short interruptions and voltage changes Disturbance test
---GB/T 17626.12-2013 Electromagnetic compatibility test and measurement technology ringing wave immunity test; ---GB/T 17626.13-2006 Electromagnetic compatibility test and measurement technology AC power port harmonics, interharmonics and grid letters Low frequency immunity test;
---GB/T 17626.14-2005 Electromagnetic compatibility test and measurement technology voltage fluctuation immunity test; ---GB/T 17626.15-2011 Electromagnetic compatibility test and measurement technology scintillator function and design specifications; ---GB/T 17626.16-2007 Electromagnetic compatibility test and measurement technology 0Hz~150kHz common mode conducted disturbance immunity test;
---GB/T 17626.17-2005 Electromagnetic compatibility test and measurement technology DC power input port ripple immunity test; ---GB/T 17626.18-2016 Electromagnetic compatibility test and measurement technology damping oscillatory wave immunity test; ---GB/T 17626.20-2014 Electromagnetic Compatibility Test and Measurement Technology Emission and Immunity in Transverse Electromagnetic Wave (TEM) Waveguides Degree test
---GB/T 17626.21-2014 Electromagnetic compatibility test and measurement technology mixing chamber test method; ---GB/T 17626.22-2017 Electromagnetic compatibility test and measurement technology Radiation emission and immunity in full anechoic chamber measuring;
---GB/T 17626.24-2012 Electromagnetic compatibility test and measurement technology Test of HEMP conducted disturbance protection device method;
---GB/T 17626.27-2006 Electromagnetic compatibility test and measurement technology three-phase voltage unbalance immunity test; ---GB/T 17626.28-2006 Electromagnetic compatibility test and measurement technology power frequency change immunity test; ---GB/T 17626.29-2006 Electromagnetic compatibility test and measurement technology DC power input port voltage sag, short-term Immunity test for breaking and voltage changes;
---GB/T 17626.30-2012 Electromagnetic compatibility test and measurement technology power quality measurement method; ---GB/T 17626.34-2012 Electromagnetic compatibility test and measurement technology for main power supply per phase current greater than 16A Voltage dip, short interruption and voltage variation immunity test.
This part is the fourth part of GB/T 17626.
This part is drafted in accordance with the rules given in GB/T 1.1-2009. This part replaces GB/T 17626.4-2008 "Electromagnetic Compatibility Test and Measurement Technology Electrical Fast Transient Burst Immunity Test". Compared with GB/T 17626.4-2008, the main technical changes are as follows. --- Removed the reference standard IEC 60050-300..2001, International Electrotechnical Vocabulary Electrical and Electronic Measurement and Measurement Instruments 311 Part. General terms relating to measurement; Part 312. General terms relating to electrical measurements; Part 313. Electrical measurements Type of gauge; Section 314. Specific terms based on gauge type (see Chapter 2); ---Added 1 term and definition (see 3.1.1);
--- Added abbreviations (see 3.2);
--- Removed the main components of the test generator (see 6.2.1);
--- Increased the calculation formula of Figure 3 and the ideal waveform (see 6.2.2); --- Removed the "single pulse waveform of Figure 3 connected to 50Ω load", adding the "single pulse of Figure 3 output to 50Ω load Think of the waveform (see Figure 3 of 6.2.2)";
--- Added the calibration content of the 6.4.2 capacitive coupling clip, adding Figure 7, Figure 8 (see 6.4.2); --- Added 7.2.2 test instrument verification (see 7.2.2);
--- Add the label after the capacitive coupling clip in Figure 11 (see Figure 11); --- Modified the test arrangement of the top entry device, added Figure 13 (see Figure 7.2.2 Figure 13); --- Removed Figure 12, added Figure 15 (see Figure 7.4.2 Figure 15);
--- Added Appendix C information on measurement uncertainty (see Appendix C); --- Removed 1 of Table C.1 and Table C.2 of Appendix C (see Appendix C, Table C.1 and Table C.2); --- Revised Appendix C Table C.1 where A is α and in Appendix C there is no A (see Appendix C, Table C.1). This section uses the translation method equivalent to IEC 61000-4-4.2012 Electromagnetic Compatibility (EMC) Part 4-4. Test and Measurement Techniques Electrical fast transient burst immunity test.
This section has made the following editorial changes.
--- In line with the existing standard series, change the name of this part to "Electromagnetic Compatibility Test and Measurement Technology Electric Fast Transient Burst Group Immunity test.
This part is proposed and managed by the National Electromagnetic Compatibility Standardization Technical Committee (SAC/TC246). This section drafted by. Shanghai Industrial Automation Instrumentation Research Institute Co., Ltd., Shanghai Institute of Metrology and Testing Technology, China Electric Power Division Research Institute Co., Ltd., Shanghai Instrumentation Automatic Control System Inspection and Testing Institute Co., Ltd. The main drafters of this section. Wang Ying, Weng Haifeng, Yu Lei, Zhang Yixiang, Gong Zeng, Li Ni, Zhou Pengcheng, Fei Jie. The previous versions of the standards replaced by this section are.
---GB/T 17626.4-1998, GB/T 17626.4-2008.
Electromagnetic compatibility test and measurement technology
Electrical fast transient burst immunity test
1 Scope
This part of GB/T 17626 deals with the immunity requirements and test methods for electrical and electronic equipment for repetitive electrical fast transients. this In addition, the scope of the test level is specified and the test procedure is determined. The purpose of this section is to evaluate the electrical power port, signal, control, and ground ports of electrical and electronic equipment during electrical fast transients. The performance of the bursts determines a common basis for the reproducibility of the assessment. The test methods specified in this section describe an evaluation device or system. A consistent method for the consistency of defined phenomena.
Note. As described in IEC Guide 107, this section is the basic EMC standard for use by product committees. IEC Guideline 107 also specifies that the Product Committee The committee is responsible for determining whether or not to apply this immunity test standard. If used, it is responsible for determining the appropriate test level and performance criteria. National Electromagnetics The Standardization Technical Committee and its subcommittees are willing to work with the Product Committee to evaluate the specific immunity requirements of their products. This section specifies.
---Test voltage waveform;
---The scope of the test level;
---Test equipment;
--- Calibration and verification procedures for test equipment;
---Test arrangement;
--- Test procedure.
This section gives technical specifications for testing in the laboratory and in the field. 2 Normative references
The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article. Pieces. For undated references, the latest edition (including all amendments) applies to this document. GB/T 4365-2003 Electrotechnical terminology electromagnetic compatibility [IEC 60050 (161)..1990, IDT] 3 terms and definitions, abbreviations
3.1 Terms and definitions
The following terms and definitions as defined in GB/T 4365-2003 apply to this document. 3.1.1
Auxiliary equipment auxiliaryequipment; AE
A device that provides the required signals for the normal operation of the device under test (EUT) and a device that verifies EUT performance. 3.1.2
Burst burst
A limited number of clearly identifiable pulse sequences or oscillations of limited duration. [GB/T 4365-2003, definition 2.2]
3.1.3
Calibration calibration
A set of operations that establish a relationship between the labeled value and the measured result by reference standard under the specified conditions with reference to the standard. Note 1. This term is used in the “uncertainty” method.
Note 2. In principle, the relationship between the marked value and the measured result can be represented by a calibration chart. [GB/T 2900.77-2008, definition 311-01-09]
3.1.4
Coupling coupling
The interaction between lines transfers energy from one line to another. 3.1.5
Common mode (coupling) commonmode(coupling)
It is also coupled to all conductors to the ground reference plane.
3.1.6
Coupling clamp couplingclamp
a predetermined size that couples the disturbance signal to the test line in a common mode without any electrical connection to the line under test. And a feature of the equipment.
3.1.7
Coupling network couplingnetwork
A circuit used to transfer energy from one line to another.
3.1.8
Decoupling network decouplingnetwork
An electrical fast transient voltage applied to prevent application to the device under test from affecting other circuits, devices, or systems that are not tested. 3.1.9
(performance) degradation (ofperformance)
Undesirable deviations in performance between a device, device, or system from normal performance. Note. The term "lowering" can be used for temporary or permanent failure. [GB/T 4365-2003, definition 2.1]
3.1.10
EFT/Belectricalfasttransient/burst
Electrical fast transient bursts.
3.1.11
Electromagnetic compatibility electromagneticcompatibility; EMC
A device or system that works properly in its electromagnetic environment and does not constitute an unacceptable electromagnetic disturbance to anything in the environment. ability.
[GB/T 4365-2003, definition 2.1]
3.1.12
EUTequipmentundertest
Test equipment.
3.1.13
Ground reference plane groundreferenceplane
A conductive plane whose potential is used as a common reference potential. [GB/T 4365-2003, definition 2.4]
3.1.14
Immunity (toadisturbance)
The ability of a device, device, or system to experience electromagnetic disturbances without degrading operational performance. [GB/T 4365-2003, definition 2.1]
3.1.15
Port port
A special interface between the device under test and the external electromagnetic environment. 3.1.16
Pulse width pulsewidth
The time interval when the instantaneous value reaches 50% of the rising edge of the first pulse and 50% of the last falling edge is reached. Note. Rewrite IEC 60050 (702)..2001, definition 702-03-04
3.1.17
Rise time risetime
The time it takes for the pulse instantaneous value to rise from 10% of the pulse amplitude to 90% for the first time. [GB/T 4365-2003, definition 2.2]
3.1.18
Transient transient
A physical quantity or physical phenomenon that changes between two adjacent stable states whose change time is less than the time scale of interest. [GB/T 4365-2003, definition 2.2]
3.1.19
Asymmetric mode (coupling) unsymmetricmode(coupling)
Single line coupling with respect to the ground reference plane.
3.1.20
Verification verification
Used to inspect test equipment systems (eg, test generators and interconnecting cables) to demonstrate a complete set of operations for the test system to function properly. Note 1. The method of verification may be different from the calibration method. Note 2. For the purposes of this basic EMC standard, this definition differs from the definition given in IEV311-01-13. 3.2 Abbreviations
The following abbreviations apply to this document.
AE Auxiliary Equipment (AuxiliaryEquipment)
CDN Coupling/Decoupling Network
EFT/B Electrical Fast Transient Burst (ElectricalFastTransient/Burst)
EMC Electromagnetic Compatibility (ElectroMagneticCompatibility)
ESD Electrostatic Discharge (ElectroStaticDischarge)
EUT device under test (EquipmentUnderTest)
GRP ground reference plane (GroundReferencePlane)
MU measurement uncertainty (MeasurementUncertainty)
PE protective grounding (ProtectiveEarth)
TnL nonlinear terminal (TerminatornonLinearity)
4 Overview
Repetitive fast transient test is a method of coupling a pulse group consisting of many fast transient pulses to the power supply of electrical and electronic equipment. Test of port, control port, signal port and ground port. The main points of the test are high amplitude of transients, short rise time, high repetition rate and low energy. See Appendix A for quantities.
This test is to verify electrical and electronic equipment such as from switching transients (cutting inductive loads, relay contact bounces, etc.) The immunity of various types of transient disturbances.
5 test level
Table 1 lists the priority for electrical fast transient testing of the device's power, control, signal, and ground ports. Test level used.
Table 1 Test level
Open circuit output test voltage and pulse repetition frequency
grade
Power port and ground port (PE) signal port and control port
Voltage peak
kV
repeat frequency
kHz
Voltage peak
kV
repeat frequency
kHz
1 0.5 5 or 100 0.25 5 or 100
2 1 5 or 100 0.5 5 or 100
3 2 5 or 100 1 5 or 100
4 4 5 or 100 2 5 or 100
Xa specific to a specific specific
A repetition rate of 5 kHz is conventionally used; however, 100 kHz is closer to the actual situation. The product standardization technical committee should decide with a specific product or Those frequencies associated with the product type.
For some products, there is no clear distinction between the power port and the signal port. In this case, it should be tested by the Product Standardization Technical Committee. The purpose is to determine how to proceed.
a “X” can be of any grade and should be specified in the special equipment specification. See Appendix B for the selection of test levels.
6 test equipment
6.1 Overview
6.2.3, 6.3.2 and 6.4.2 calibration procedures ensure test generators, coupling/decoupling networks and other units that constitute the test arrangement Proper operation so that the expected waveform is applied to the device under test. 6.2 Pulse group generator
6.2.1 Overview
A schematic diagram of the generator is given in Figure 1. The generator is opened and connected via selected circuit components Cc, Rs, Rm and Cd A fast transient occurs under a 50Ω resistive load condition. The effective output impedance of the signal generator should be 50Ω. element.
U --- high voltage source;
Rc --- charging resistor;
Cc --- storage capacitors;
Rs --- pulse duration adjustment resistor;
Rm --- impedance matching resistor;
Cd --- DC blocking capacitor;
Switch---high voltage switch.
Note. Switching characteristics and distribution (inductance and capacitance) have an effect on rise time. Figure 1 Schematic diagram of the main components of the fast transient burst generator 6.2.2 Fast transient burst generator characteristics
The characteristics of the fast transient burst generator are as follows. ---1000Ω load output voltage range at least from 0.24kV~3.8kV;
The output voltage range is -0.125kV~2kV at -50Ω load.
The generator should be able to operate under short circuit conditions without being damaged. characteristic.
---Polarity. Positive polarity, negative polarity
--- Output type. coaxial output, 50Ω
--- DC blocking capacitor. (10 ± 2) nF
---Repetition frequency. (See Table 2) Repeat frequency value × (1 ± 20%) kHz --- Relationship with AC power. Asynchronous
---Burst duration. (15 ± 3) ms at 5kHz
(See Figure 2) (0.75 ± 0.15) ms at 100kHz
---Burst period. (300 ± 60) ms
(See Figure 2)
---Pulse waveform
● Output to 50Ω load rise time tr=(5±1.5) ns
Pulse width tw = (50 ± 15) ns
Peak voltage. according to the voltage value of Table 2 × (1 ± 10%)
(The waveform of the 50Ω load is shown in Figure 3.)
● Output to 1000Ω load rise time tr=(5±1.5) ns
Pulse width tw=50ns, allowing deviation from -15ns to 100ns
Peak voltage. according to the voltage value of Table 2 × (1 ± 20%)
(See Note 1 of Table 2)
Figure 2 Electrical fast transient pulse group overview
Figure 3 Ideal waveform of a single pulse output to a 50Ω load (tr=5ns, tw=50ns) Figure 3 is the calculation formula for the ideal waveform vEFT(t).
vEFT(t)=kv
V1
kEFT×
Τ1
nEFT
1 tτ1
nEFT×e
Τ2
In the formula.
kEFT=e-
Τ1
Τ2×
nEFT×τ2
Τ1( )
nEFT
Kv---max...

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