GB/T 17626.11-2008: Electromagnetic compatibility -- Testing and measurement techniques -- Voltage dips, short interruptions and voltage variations immunity tests

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Scope

This Part of GB/T 17626 defines the immunity test methods and range of preferred test levels
for electrical and electronic equipment connected to low-voltage power supply networks for
voltage dips, short interruptions, and voltage variations.
This Standard applies to electrical and electronic equipment having a rated input current not
exceeding 16 A per phase, for connection to 50 Hz or 60 Hz a.c. networks.
It does not apply to electrical and electronic equipment for connection to 400 Hz a.c.
networks. Tests for these networks will be covered by future IEC standards.
The objective of this Standard is to establish a common reference for evaluating the immunity
of electrical and electronic equipment when subjected to voltage dips, short interruptions and
voltage variations.
NOTE Voltage fluctuation immunity tests are covered by GB/T 17626.14-2006.
The test method documented in this Part of GB/T 17626 describes a consistent method to
assess the immunity of equipment or a system against a defined phenomenon. As described in
GB/Z 18509-2001, this is a basic EMC publication for use by product committees of the IEC.
As also stated in GB/Z 18509-2001, the IEC product committees are responsible for
determining whether this immunity test standard shall be applied or not, and, if applied, they
are responsible for defining the appropriate test levels. The EMC Standardization Technical
committee and its sub-committees are prepared to co-operate with product committees in the
evaluation of the value of particular immunity tests for their products.

Basic Data

Standard ID	GB/T 17626.11-2008 (GB/T17626.11-2008)
Description (Translated English)	Electromagnetic compatibility -- Testing and measurement techniques -- Voltage dips, short interruptions and voltage variations immunity tests
Sector / Industry	National Standard (Recommended)
Classification of Chinese Standard	L06
Classification of International Standard	33.100.20
Word Count Estimation	21,283
Date of Issue	2008-05-20
Date of Implementation	2009-01-01
Older Standard (superseded by this standard)	GB/T 17626.11-1999
Quoted Standard	GB/T 4365-2003; GB/Z 18509-2001; IEC 61000.2.8-2002
Adopted Standard	IEC 61000-4-11-2004, IDT
Regulation (derived from)	Announcement of Newly Approved National Standards 2008 No. 8 (No. 121 overall)
Issuing agency(ies)	General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary	This standard specifies the low-voltage supply grid connected electrical and electronic equipment to voltage dips, short interruptions and voltage variations immunity test methods and range of preferred test level. This section applies to the rated input current not exceeding 16A per phase 50Hz or 60Hz AC is connected to the network of electrical and electronic equipment. This section does not apply to 400Hz AC networks connected electrical and electronic equipment. These networks will in the future standard tests involved. The purpose of this section is to establish an evaluation of electrical and electronic equipment subjected to voltage dips, short interruptions and voltage variations immunity of the general guidelines.