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See Chinese contents: GB/T 17473.2-2008 GB/T 17473.2-2008: Test methods of precious metals pastes used for microelectronics -- Determination of fineness
This Part specifies the scraper determination method for the fineness of precious metal pastes, which are used in microelectronics technology. This Part applies to the determination of the fineness of precious metal pastes, for microelectronics technologies.
