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See Chinese contents: GB/T 17473.1-2008 GB/T 17473.1-2008: Test methods of precious metals pastes used for microelectronics -- Determination of solids content
This Part specifies the test method for the solid content in the precious metal paste, for microelectronics technology. This Part applies to the determination of the solid content of precious metal pastes, for various sintered and solidified microelectronics technologies.
