GB/T 17473.1-2008: Test methods of precious metals pastes used for microelectronics -- Determination of solids content

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Scope

This Part specifies the test method for the solid content in the precious metal
paste, for microelectronics technology.
This Part applies to the determination of the solid content of precious metal
pastes, for various sintered and solidified microelectronics technologies.

Basic Data

Standard ID	GB/T 17473.1-2008 (GB/T17473.1-2008)
Description (Translated English)	Test methods of precious metals pastes used for microelectronics -- Determination of solids content
Sector / Industry	National Standard (Recommended)
Classification of Chinese Standard	H68
Classification of International Standard	77.120.99
Word Count Estimation	5,577
Date of Issue	2008-03-31
Date of Implementation	2008-09-01
Older Standard (superseded by this standard)	GB/T 17473.1-1998
Quoted Standard	GB/T 8170
Regulation (derived from)	National Standard Approval Announcement 2008 No.5 (Total No.118)
Issuing agency(ies)	General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary	This standard specifies test methods microelectronics precious metal slurry solids content. This section applies to a variety of sintered and curing microelectronics precious metal slurry solids content determination.