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See Chinese contents: GB/T 14849.4-2014 GB/T 14849.4-2014: Methods for chemical analysis of silicon metal -- Part 4: Determination of impurity elements content -- Inductively coupled plasma atomic emission spectrometric method
This part of GB/T 14849 specifies the determination methods of iron, aluminum, calcium, manganese, titanium, nickel, copper, chromium, vanadium, magnesium, cobalt, phosphorus, potassium, sodium, lead, zinc, boron in industrial silicon.
