JJG 810-1993: Verification Regulation for Wavelength Dispersive X-Ray Fluorescence Spectrometers

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Scope

X-ray fluorescence spectrometers are used for elemental analysis of solid, powder or
liquid substances. The basic principle of operation is that the primary X-rays emitted
by the X-ray tube excite the atoms in the sample. The generated fluorescent X-rays are
split by a crystal and measured by a detector. The qualitative and quantitative analysis
of the elements is carried out based on the wavelength and intensity of the characteristic
X-ray fluorescence spectrum of various elements.
The basic structure of a wavelength dispersive X-ray fluorescence spectrometer is
shown in Figure 1.
specified in the instrument technical standards" as the standard for calibrating the X-ray count rate.
If the initial X-ray count rate after the replacement of the parts is equal to or lower than the factory
index value, the factory index value will replace the original "initial count rate under the
measurement conditions specified in the instrument technical standards" as the standard for
verifying the X-ray count rate.
For new instruments within the quality assurance period, this technical requirement shall be
implemented in accordance with the product technical standards.
(4) λ - The wavelength of the X-rays of the analyzed element, in nm.
(5) If the maximum count rate measured when the X-ray tube is at the maximum rated power is
61~89% of the maximum linear count rate specified by the instrument, then the count rate value
deviation of Class A is calculated based on the maximum count rate measured. If the maximum
count rate measured is equal to or lower than 60% of the instrument's current maximum linear count
rate, no distinction is made between level A and level B. The count rate deviation is calculated based
on the maximum count rate actually measured. When CD≤1%, it is level A.

Basic Data

Standard ID	JJG 810-1993 (JJG810-1993)
Description (Translated English)	Verification Regulation for Wavelength Dispersive X-Ray Fluorescence Spectrometers
Sector / Industry	Metrology and Measurement Industry Standard
Classification of Chinese Standard	A60
Word Count Estimation	10,195
Date of Issue	6/15/1905
Date of Implementation	6/1/1993
Issuing agency(ies)	State Bureau of Technical Supervision
Summary	This standard applies to new production, use and repair of all types of post-wavelength dispersive X-ray fluorescence spectrometer test.