GB/T 37254-2018: High purity silicon carbide -- Determination of trace elements

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Scope

This standard specifies a method for determining the content of trace elements in high-
purity silicon carbide, by inductively coupled plasma atomic emission spectroscopy
(ICP-OES) method and inductively coupled plasma mass spectroscopy (ICP-MS)
method.
This standard is applicable to the determination of 16 elements such as aluminum,
arsenic, calcium, chromium, copper, iron, mercury, potassium, magnesium, manganese,
sodium, nickel, lead, sulfur, titanium, zinc in high-purity silicon carbide materials,
which have a mass fraction content of more than or equal to 99.9%. The measurement
range of each element is shown in Table 1 (based on mass fraction).

Basic Data

Standard ID	GB/T 37254-2018 (GB/T37254-2018)
Description (Translated English)	High purity silicon carbide -- Determination of trace elements
Sector / Industry	National Standard (Recommended)
Classification of Chinese Standard	A43
Classification of International Standard	71.040.50
Word Count Estimation	9,975
Date of Issue	2018-12-28
Date of Implementation	2019-09-01
Regulation (derived from)	National Standard Announcement No. 17 of 2018
Issuing agency(ies)	State Administration for Market Regulation, China National Standardization Administration