{"product_id":"gbt24582-2023","title":"GB\/T 24582-2023 English PDF (GB\/T24582-2023)","description":"\u003ch1\u003eGB\/T 24582-2023: Test method for measuring surface metal impurity content of polycrystalline silicon - Acid extraction-inductively coupled plasma mass spectrometry method\u003c\/h1\u003e\u003cb style=\"font-size:16px;\"\u003eDelivery:\u003c\/b\u003e 9 seconds. Download (and Email) true-PDF + Invoice.\u003cbr\u003e\u003cb style=\"font-size:16px;\"\u003eGet Quotation:\u003c\/b\u003e Click \u003ca style=\"color: blue;\" href=\"https:\/\/www.chinesestandard.net\/Cart\/Cart.aspx?GB\/T%2024582-2023_English\" rel=\"nofollow\"\u003eGB\/T 24582-2023\u003c\/a\u003e (Self-service in 1-minute)\u003cbr\u003e\u003cb style=\"font-size:16px;\"\u003eNewer \/ historical versions: \u003c\/b\u003e \u003ca style=\"color: blue;\" href=\"https:\/\/www.chinesestandard.net\/PDF.aspx\/GBT24582-2023\"\u003eGB\/T 24582-2023\u003c\/a\u003e\u003ch2\u003ePreview True-PDF\u003c\/h2\u003e\u003ciframe src=\"https:\/\/www.chinesestandard.net\/Preview_PDF.aspx\/GBT24582-2023\" width=\"445\" height=\"600\" title=\"GB\/T 24582-2023 True-PDF\"\u003e\u003c\/iframe\u003e \u003cbr\u003e\u003ch2\u003eScope\u003c\/h2\u003eThis document describes a method for leaching metal impurities from the surface of \u003cbr\u003epolycrystalline silicon using acid and quantitatively determining the content of these \u003cbr\u003eimpurities using inductively coupled plasma mass spectrometry (ICP-MS). \u003cbr\u003eThis document is applicable to the determination of the content of impurity elements - \u003cbr\u003eincluding alkali metals, alkaline earth metals, and first-series transition elements (such \u003cbr\u003eas sodium, potassium, calcium, iron, nickel, copper, zinc, and aluminum) - on the \u003cbr\u003esurface of solar-grade and electronic-grade polycrystalline silicon. The determination \u003cbr\u003elimit is 0.01 ng\/g. \u003cbr\u003e\u003cbr\u003e\u003ch2\u003eBasic Data\u003c\/h2\u003e\u003ctable id=\"TableTabAbout0\" rules=\"all\" border=\"1\" style=\"font-family:Arial;font-size:Small;\"\u003e  \u003ctr id=\"TableTabRow10\"\u003e     \u003ctd id=\"TableTabCell110\" align=\"center\" font=\"bold\"\u003e \u003cb\u003eStandard ID\u003c\/b\u003e \u003c\/td\u003e    \u003ctd id=\"TableTabCell120\" align=\"center\"\u003e GB\/T 24582-2023 (GB\/T24582-2023)\u003c\/td\u003e  \u003c\/tr\u003e\n\u003ctr id=\"TableTabRow20\"\u003e     \u003ctd id=\"TableTabCell210\" align=\"center\" font=\"bold\"\u003e \u003cb\u003eDescription (Translated English)\u003c\/b\u003e \u003c\/td\u003e    \u003ctd id=\"TableTabCell220\" align=\"center\"\u003e Test method for measuring surface metal impurity content of polycrystalline silicon - Acid extraction-inductively coupled plasma mass spectrometry method\u003c\/td\u003e  \u003c\/tr\u003e\n\u003ctr id=\"TableTabRow30\"\u003e     \u003ctd id=\"TableTabCell310\" align=\"center\" font=\"bold\"\u003e \u003cb\u003eSector \/ Industry\u003c\/b\u003e \u003c\/td\u003e    \u003ctd id=\"TableTabCell320\" align=\"center\"\u003e National Standard (Recommended)\u003c\/td\u003e  \u003c\/tr\u003e\n\u003ctr id=\"TableTabRow40\"\u003e     \u003ctd id=\"TableTabCell410\" align=\"center\" font=\"bold\"\u003e \u003cb\u003eClassification of Chinese Standard\u003c\/b\u003e \u003c\/td\u003e    \u003ctd id=\"TableTabCell420\" align=\"center\"\u003e H17\u003c\/td\u003e  \u003c\/tr\u003e\n\u003ctr id=\"TableTabRow50\"\u003e     \u003ctd id=\"TableTabCell510\" align=\"center\" font=\"bold\"\u003e \u003cb\u003eClassification of International Standard\u003c\/b\u003e \u003c\/td\u003e    \u003ctd id=\"TableTabCell520\" align=\"center\"\u003e 77.040\u003c\/td\u003e  \u003c\/tr\u003e\n\u003ctr id=\"TableTabRow60\"\u003e     \u003ctd id=\"TableTabCell610\" align=\"center\" font=\"bold\"\u003e \u003cb\u003eWord Count Estimation\u003c\/b\u003e \u003c\/td\u003e    \u003ctd id=\"TableTabCell620\" align=\"center\"\u003e 10,175\u003c\/td\u003e  \u003c\/tr\u003e\n\u003ctr id=\"TableTabRow70\"\u003e     \u003ctd id=\"TableTabCell710\" align=\"center\" font=\"bold\"\u003e \u003cb\u003eDate of Issue\u003c\/b\u003e \u003c\/td\u003e    \u003ctd id=\"TableTabCell720\" align=\"center\"\u003e 2023-08-06\u003c\/td\u003e  \u003c\/tr\u003e\n\u003ctr id=\"TableTabRow80\"\u003e     \u003ctd id=\"TableTabCell810\" align=\"center\" font=\"bold\"\u003e \u003cb\u003eDate of Implementation\u003c\/b\u003e \u003c\/td\u003e    \u003ctd id=\"TableTabCell820\" align=\"center\"\u003e 2024-03-01\u003c\/td\u003e  \u003c\/tr\u003e\n\u003ctr id=\"TableTabRow90\"\u003e     \u003ctd id=\"TableTabCell910\" align=\"center\" font=\"bold\"\u003e \u003cb\u003eOlder Standard (superseded by this standard)\u003c\/b\u003e \u003c\/td\u003e    \u003ctd id=\"TableTabCell920\" align=\"center\"\u003e GB\/T 24582-2009\u003c\/td\u003e  \u003c\/tr\u003e\n\u003ctr id=\"TableTabRow100\"\u003e     \u003ctd id=\"TableTabCell1010\" align=\"center\" font=\"bold\"\u003e \u003cb\u003eIssuing agency(ies)\u003c\/b\u003e \u003c\/td\u003e    \u003ctd id=\"TableTabCell1020\" align=\"center\"\u003e State Administration for Market Regulation, China National Standardization Administration\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e\u003cbr\u003e\u003cbr\u003e","brand":"www.ChineseStandard.us -- Field Test Asia Pte. Ltd.","offers":[{"title":"Default Title","offer_id":53657126961466,"sku":null,"price":175.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0821\/5737\/1706\/files\/GBT24582-2023EN.1.jpg?v=1782642536","url":"https:\/\/www.chinesestandard.us\/products\/gbt24582-2023","provider":"www.ChineseStandard.us (www.ChineseStandard.net)","version":"1.0","type":"link"}